Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning

Wei Lin; Haihua Cui; Wei Zheng; Xinfang Zhou; Zhenlong Xu; Wei Tian

doi:10.3788/LOP202259.2210009

Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 22 >Page 2210009 > Article

Laser & Optoelectronics Progress
Vol. 59, Issue 22, 2210009 (2022)

Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning

Wei Lin¹, Haihua Cui^1、*, Wei Zheng², Xinfang Zhou², Zhenlong Xu¹, and Wei Tian¹

Author Affiliations

¹College of Mechanical & Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, Jiangsu, China

²AVIC Xi'an Aircraft Industry Group Co., Ltd., Xi'an 710089, Shaanxi, China

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DOI: 10.3788/LOP202259.2210009 Cite this Article Set citation alerts

Wei Lin, Haihua Cui, Wei Zheng, Xinfang Zhou, Zhenlong Xu, Wei Tian. Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning[J]. Laser & Optoelectronics Progress, 2022, 59(22): 2210009 Copy Citation Text

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