• Laser & Optoelectronics Progress
  • Vol. 59, Issue 22, 2210009 (2022)
Wei Lin1, Haihua Cui1、*, Wei Zheng2, Xinfang Zhou2, Zhenlong Xu1, and Wei Tian1
Author Affiliations
  • 1College of Mechanical & Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, Jiangsu, China
  • 2AVIC Xi'an Aircraft Industry Group Co., Ltd., Xi'an 710089, Shaanxi, China
  • show less
    DOI: 10.3788/LOP202259.2210009 Cite this Article Set citation alerts
    Wei Lin, Haihua Cui, Wei Zheng, Xinfang Zhou, Zhenlong Xu, Wei Tian. Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning[J]. Laser & Optoelectronics Progress, 2022, 59(22): 2210009 Copy Citation Text show less

    Abstract

    As a noncontact high-precision optical full-field measurement method, shearography can be used for the nondestructive detection of internal defects in composite materials. However, the obtained phase fringe pattern contains a high amount of speckle noise that seriously affects the detection results and accuracy. Therefore, we propose a phase fringe-filtering method using an unsupervised image style conversion model (CycleGAN). Furthermore, the original noise phase fringe image obtained using shearography is converted into an ideal noiseless fringe image via network training to achieve noise filtering in the phase fringe pattern. The experimental results show that the proposed method achieves high-efficiency filtering for noise in areas where the stripe distribution is relatively sparse, with clear boundaries and significant contrast in filtered images. Additionally, the running time of the proposed method is better than that of the other methods (by approximately 30 ms), achieves high-quality filtering, meets the development demand of dynamic nondestructive testing, and provides a new idea for the noise filtering of phase fringe pattern.
    Wei Lin, Haihua Cui, Wei Zheng, Xinfang Zhou, Zhenlong Xu, Wei Tian. Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning[J]. Laser & Optoelectronics Progress, 2022, 59(22): 2210009
    Download Citation