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    Journals >Advanced Photonics >Volume 3 >Issue 6 >Page 066001 > Article
    • Advanced Photonics
    • Vol. 3, Issue 6, 066001 (2021)
    Direct characterization of coherence of quantum detectors by sequential measurements
    Liang Xu1,2,3,4,5,†, Huichao Xu1,2,3,4,6, Jie Xie1,2,3,4, Hui Li1,2,3,4..., Lin Zhou1,2,3,4, Feixiang Xu1,2,3,4 and Lijian Zhang1,2,3,4,*|Show fewer author(s)
    Author Affiliations
  • 1Nanjing University, College of Engineering and Applied Sciences, Nanjing, China
  • 2Nanjing University, Collaborative Innovation Center of Advanced Microstructures, Nanjing, China
  • 3Nanjing University, National Laboratory of Solid State Microstructures, Nanjing, China
  • 4Nanjing University, Key Laboratory of Intelligent Optical Sensing and Manipulation, Nanjing, China
  • 5Research Center for Quantum Sensing, Zhejiang Laboratory, Hangzhou, China
  • 6Purple Mountain Laboratories, Nanjing, China
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    DOI: 10.1117/1.AP.3.6.066001 Cite this Article Set citation alerts
    Liang Xu, Huichao Xu, Jie Xie, Hui Li, Lin Zhou, Feixiang Xu, Lijian Zhang, "Direct characterization of coherence of quantum detectors by sequential measurements," Adv. Photon. 3, 066001 (2021) Copy Citation Text show less
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    Article index updated: May. 29, 2025
    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 11 article(s) from Web of Science.
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    Liang Xu, Huichao Xu, Jie Xie, Hui Li, Lin Zhou, Feixiang Xu, Lijian Zhang, "Direct characterization of coherence of quantum detectors by sequential measurements," Adv. Photon. 3, 066001 (2021)
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