Direct characterization of coherence of quantum detectors by sequential measurements

Liang Xu; Huichao Xu; Jie Xie; Hui Li; Lin Zhou; Feixiang Xu; Lijian Zhang

doi:10.1117/1.AP.3.6.066001

Journals >Advanced Photonics >Volume 3 >Issue 6 >Page 066001 > Article

Advanced Photonics
Vol. 3, Issue 6, 066001 (2021)

Direct characterization of coherence of quantum detectors by sequential measurements

Liang Xu^{1、2、3、4、5、†}, Huichao Xu^{1、2、3、4、6}, Jie Xie^{1、2、3、4}, Hui Li^{1、2、3、4}, Lin Zhou^{1、2、3、4}, Feixiang Xu^{1、2、3、4}, and Lijian Zhang^{1、2、3、4、*}

Author Affiliations

¹Nanjing University, College of Engineering and Applied Sciences, Nanjing, China

²Nanjing University, Collaborative Innovation Center of Advanced Microstructures, Nanjing, China

³Nanjing University, National Laboratory of Solid State Microstructures, Nanjing, China

⁴Nanjing University, Key Laboratory of Intelligent Optical Sensing and Manipulation, Nanjing, China

⁵Research Center for Quantum Sensing, Zhejiang Laboratory, Hangzhou, China

⁶Purple Mountain Laboratories, Nanjing, China

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DOI: 10.1117/1.AP.3.6.066001 Cite this Article Set citation alerts

Liang Xu, Huichao Xu, Jie Xie, Hui Li, Lin Zhou, Feixiang Xu, Lijian Zhang. Direct characterization of coherence of quantum detectors by sequential measurements[J]. Advanced Photonics, 2021, 3(6): 066001 Copy Citation Text

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