• Photonics Research
  • Vol. 10, Issue 5, 1146 (2022)
Ruichao Zhu1, Jiafu Wang1、4、†,*, Jinming Jiang1、5、†,*, Cuilian Xu1, Che Liu2、3, Yuxiang Jia1, Sai Sui1, Zhongtao Zhang1, Tonghao Liu1, Zuntian Chu1, Jun Wang1, Tie Jun Cui2、3、6、†,*, and Shaobo Qu1、7、†,*
Author Affiliations
  • 1Shaanxi Key Laboratory of Artificially-Structured Functional Materials and Devices, Air Force Engineering University, Xi’an 710051, China
  • 2Institute of Electromagnetic Space, Southeast University, Nanjing 210096, China
  • 3State Key Laboratory of Millimeter Wave, Southeast University, Nanjing 210096, China
  • 4e-mail: wangjiafu1981@126.com
  • 5e-mail: 88jiangjinming@163.com
  • 6e-mail: tjcui@seu.edu.cn
  • 7e-mail: qushaobo@mail.xjtu.edu.cn
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    DOI: 10.1364/PRJ.442648 Cite this Article Set citation alerts
    Ruichao Zhu, Jiafu Wang, Jinming Jiang, Cuilian Xu, Che Liu, Yuxiang Jia, Sai Sui, Zhongtao Zhang, Tonghao Liu, Zuntian Chu, Jun Wang, Tie Jun Cui, Shaobo Qu. Machine-learning-empowered multispectral metafilm with reduced radar cross section, low infrared emissivity, and visible transparency[J]. Photonics Research, 2022, 10(5): 1146 Copy Citation Text show less
    Schematic of this work: a multispectral compatible metasurface is designed via machine learning, which is compatible with VIS, infrared, and microwave frequencies.
    Fig. 1. Schematic of this work: a multispectral compatible metasurface is designed via machine learning, which is compatible with VIS, infrared, and microwave frequencies.
    Structure design: (a) three-dimensional structure diagram and geometrical parameter of the unit, (b) the architecture of BPNN, and (c)–(e) details of neurons.
    Fig. 2. Structure design: (a) three-dimensional structure diagram and geometrical parameter of the unit, (b) the architecture of BPNN, and (c)–(e) details of neurons.
    Process and results of NN training: (a) the variation of MSE in the training process, (b) examination of the training process, (c) error histogram of trained network, and (d) the regression plot of all the samples.
    Fig. 3. Process and results of NN training: (a) the variation of MSE in the training process, (b) examination of the training process, (c) error histogram of trained network, and (d) the regression plot of all the samples.
    Prediction and verification of structures and EM response by the NN: (a) six generated curves, (b) structural parameters of network prediction, (c) simulation results of the predicted structures, (d) the structures corresponding to the predicted parameters, (e) structural parameters verified by CST program for different materials, and (f) comparison between the input curves and the predicted curves with different materials.
    Fig. 4. Prediction and verification of structures and EM response by the NN: (a) six generated curves, (b) structural parameters of network prediction, (c) simulation results of the predicted structures, (d) the structures corresponding to the predicted parameters, (e) structural parameters verified by CST program for different materials, and (f) comparison between the input curves and the predicted curves with different materials.
    Structure optimization and mechanism analysis: (a) three-dimensional structure diagram and geometrical parameter of the optimized structure, (b) the simulation of co-polarization reflectivity (Ryy) at different incident angles, (c) the efficiency of different mechanisms including co-polarized reflectivity (Ryy), cross-polarized reflectivity (Rxy), and absorptivity (A), (d) the efficiency proportion of different mechanisms, (e) the E-field distribution, and (f) the surface current distribution.
    Fig. 5. Structure optimization and mechanism analysis: (a) three-dimensional structure diagram and geometrical parameter of the optimized structure, (b) the simulation of co-polarization reflectivity (Ryy) at different incident angles, (c) the efficiency of different mechanisms including co-polarized reflectivity (Ryy), cross-polarized reflectivity (Rxy), and absorptivity (A), (d) the efficiency proportion of different mechanisms, (e) the E-field distribution, and (f) the surface current distribution.
    Sample fabrication and performance characterization: (a) the processing of the metafilm, (b) the details of the fabricated metafilm, (c) the measurement of VIS light transmittance, and (d) demonstration of the flexible metafilm.
    Fig. 6. Sample fabrication and performance characterization: (a) the processing of the metafilm, (b) the details of the fabricated metafilm, (c) the measurement of VIS light transmittance, and (d) demonstration of the flexible metafilm.
    Measurement environment and results: (a) microwave measurement environment, (b) the measured and simulated reflectivities of the sample, (c) the measurement of mean infrared emissivity, and (d) the measurement of infrared emissivity at 3–14 μm.
    Fig. 7. Measurement environment and results: (a) microwave measurement environment, (b) the measured and simulated reflectivities of the sample, (c) the measurement of mean infrared emissivity, and (d) the measurement of infrared emissivity at 3–14 μm.
    Measurement of infrared radiation performance: (a) ITO (10 Ω/sq), PMMA, PET, and the metafilm on heating platform, and (b)–(d) infrared radiation detection at 28°C, 50°C, and 100°C.
    Fig. 8. Measurement of infrared radiation performance: (a) ITO (10 Ω/sq), PMMA, PET, and the metafilm on heating platform, and (b)–(d) infrared radiation detection at 28°C, 50°C, and 100°C.
    Euclidean distance matrices: (a) and (c) distance matrices of reflectivity curves, and (b) and (d) distance matrices of structural parameters.
    Fig. 9. Euclidean distance matrices: (a) and (c) distance matrices of reflectivity curves, and (b) and (d) distance matrices of structural parameters.
    Performance of BPNN for different materials: (a)–(c) the training states of BPNN for F4B, FR4, and PI materials and (d)–(f) the error of trained BPNN for F4B, FR4, and PI.
    Fig. 10. Performance of BPNN for different materials: (a)–(c) the training states of BPNN for F4B, FR4, and PI materials and (d)–(f) the error of trained BPNN for F4B, FR4, and PI.
    MaterialEpochTrainingValidationTest
    PMMA330.39660.37900.5050
    F4B210.41930.45010.5223
    FR4100.49140.54130.5642
    PI150.53580.55110.5581
    Table 1. Training Performance of Different Dielectric Substrates
    Ruichao Zhu, Jiafu Wang, Jinming Jiang, Cuilian Xu, Che Liu, Yuxiang Jia, Sai Sui, Zhongtao Zhang, Tonghao Liu, Zuntian Chu, Jun Wang, Tie Jun Cui, Shaobo Qu. Machine-learning-empowered multispectral metafilm with reduced radar cross section, low infrared emissivity, and visible transparency[J]. Photonics Research, 2022, 10(5): 1146
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