• Microelectronics
  • Vol. 52, Issue 1, 139 (2022)
XU Xiaoqing, ZHANG Zhiwen, and SU Tao
Author Affiliations
  • [in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.210112 Cite this Article
    XU Xiaoqing, ZHANG Zhiwen, SU Tao. Immunity Analysis of SRAM Under Supply RF Interference[J]. Microelectronics, 2022, 52(1): 139 Copy Citation Text show less
    References

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    [4] SU T, MARKUS U, THOMAS S, et al. Using error-source switching (ESS) concept to analyze the conducted radio frequency electromagnetic immunity of microcontrollers [J]. IEEE Trans Electromag Compatib, 2012, 54(3): 634-645.

    [5] SAWADA T, TOSHIKAWA T, YOSHIKAWA K, et al. Immunity evaluation of SRAM core using DPI with on-chip diagnosis structures [C] // 8th Workshop Electromag Compatib Integr Circ. Dubrovnik, Croatia. 2011: 65-70.

    [6] SAWADA T, TAKATA H, NII K, et al. False operation of static random access memory cells under alternating current power supply voltage variation [J]. Jpn J Appl Phys, 2013, 52(4S): 04CE14.

    [7] SAWADA T, YOSHIKAWA K, TAKATA H, et al. An extended direct power injection method for in-place susceptibility characterization of VLSI circuits against electromagnetic interference [J]. IEEE Trans VLSI Syst, 2015, 23(10): 2347-2351.

    [10] MUKHOPADHYAY S, MAHMOODI H, ROY K. Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS [J]. IEEE Trans Comput Aid Des Integr Circ & Syst, 2005, 24(12): 1859-1880.

    [11] CHAPPEL J F, SAFWAT G Z. EMI effects and timing design for increased reliability in digital systems [J]. IEEE Trans Circ & Sys I: Fundam Theo & Appl, 1997, 44(2): 130-142.

    [12] ROBINSON M P, FISCHER K, FLINTOFT I D, et al. A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance [J]. IEEE Trans Electromag Compatib, 2003, 45(3): 513-519.

    XU Xiaoqing, ZHANG Zhiwen, SU Tao. Immunity Analysis of SRAM Under Supply RF Interference[J]. Microelectronics, 2022, 52(1): 139
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