Author Affiliations
School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, Chinashow less
Fig. 1. Diaphragms of different apertures. (a) 16 mm;(b) 12 mm;(c) 8 mm;(d) 5 mm
Fig. 2. Ion beam removal function model of diaphragm in different apertures. (a) 5 mm; (b) 8 mm; (c) 12 mm; (d) 16 mm
Fig. 3. Simulation results of ion beam one-dimensional superposition with 16 mm diaphragm. (a) Superimposed effect; (b) volatility
Fig. 4. Initial profile of fused quartz sample with diameter of 120 mm
Fig. 5. Ion beam simulation of residual variation curves with 16 mm aperture
Fig. 6. Optimal surface shapes of 16 mm aperture with different number of optimizations. (a) Preliminary simulation; (b) 1st optimization; (c) 2nd optimization; (d) 3rd optimization
Fig. 7. Root mean square values of diaphragm at different apertures. (a) 12 mm; (b) 8 mm; (c) 5 mm
Fig. 8. Ion beam simulation surface residual of diaphragm at different apertures. (a) 16 mm; (b) 12 mm; (c) 8 mm; (d) 5 mm
Fig. 9. Residence time distribution
Fig. 10. Surface shape after processing
Target distance/mm | Aperture/mm | Removal characteristic |
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FWHM/mm | σ/mm | Maximum removal rate/(nm·min-1) | Effective etching diameter/mm |
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10 | 5 | 3.5 | 1.47 | 318.8 | 8.4 | 8 | 5.6 | 2.38 | 325.4 | 11.1 | 12 | 7.1 | 3.02 | 330.6 | 16.3 | 16 | 7.3 | 3.10 | 352.8 | 20.0 |
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Table 1. Removal characteristic parameters of diaphragm in different apertures
Optimization times | Residual peak to valley/nm | Residual RMS/nm | Total residence time/min |
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1 | 184.7 | 12.66 | 587.2 | 2 | 137.5 | 11.74 | 539.3 | 3 | 119.8 | 11.51 | 542.4 |
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Table 2. Modified optimization results
Aperture/mm | Optimal superimposed distance/mm | Minimum residual peak-to-valley/nm | Root mean square/nm | Total residence time/min |
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16 | 1.5σ16 | 119.80 | 11.50 | 542.40 | 12 | 1.5σ12 | 108.58 | 9.66 | 630.70 | 8 | 1.4σ8 | 87.56 | 8.23 | 744.53 | 5 | 1.4σ5 | 76.42 | 4.63 | 1136.82 |
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Table 3. Simulation results of ion beam polishing of diaphragm at different apertures