• Laser & Optoelectronics Progress
  • Vol. 58, Issue 8, 0810016 (2021)
Le Kang, Shilei Jiang*, Guobin Sun, Yuhao Zhang, and Weiguo Liu
Author Affiliations
  • School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, China
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    DOI: 10.3788/LOP202158.0810016 Cite this Article Set citation alerts
    Le Kang, Shilei Jiang, Guobin Sun, Yuhao Zhang, Weiguo Liu. Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0810016 Copy Citation Text show less
    Diaphragms of different apertures. (a) 16 mm;(b) 12 mm;(c) 8 mm;(d) 5 mm
    Fig. 1. Diaphragms of different apertures. (a) 16 mm;(b) 12 mm;(c) 8 mm;(d) 5 mm
    Ion beam removal function model of diaphragm in different apertures. (a) 5 mm; (b) 8 mm; (c) 12 mm; (d) 16 mm
    Fig. 2. Ion beam removal function model of diaphragm in different apertures. (a) 5 mm; (b) 8 mm; (c) 12 mm; (d) 16 mm
    Simulation results of ion beam one-dimensional superposition with 16 mm diaphragm. (a) Superimposed effect; (b) volatility
    Fig. 3. Simulation results of ion beam one-dimensional superposition with 16 mm diaphragm. (a) Superimposed effect; (b) volatility
    Initial profile of fused quartz sample with diameter of 120 mm
    Fig. 4. Initial profile of fused quartz sample with diameter of 120 mm
    Ion beam simulation of residual variation curves with 16 mm aperture
    Fig. 5. Ion beam simulation of residual variation curves with 16 mm aperture
    Optimal surface shapes of 16 mm aperture with different number of optimizations. (a) Preliminary simulation; (b) 1st optimization; (c) 2nd optimization; (d) 3rd optimization
    Fig. 6. Optimal surface shapes of 16 mm aperture with different number of optimizations. (a) Preliminary simulation; (b) 1st optimization; (c) 2nd optimization; (d) 3rd optimization
    Root mean square values of diaphragm at different apertures. (a) 12 mm; (b) 8 mm; (c) 5 mm
    Fig. 7. Root mean square values of diaphragm at different apertures. (a) 12 mm; (b) 8 mm; (c) 5 mm
    Ion beam simulation surface residual of diaphragm at different apertures. (a) 16 mm; (b) 12 mm; (c) 8 mm; (d) 5 mm
    Fig. 8. Ion beam simulation surface residual of diaphragm at different apertures. (a) 16 mm; (b) 12 mm; (c) 8 mm; (d) 5 mm
    Residence time distribution
    Fig. 9. Residence time distribution
    Surface shape after processing
    Fig. 10. Surface shape after processing
    Target distance/mmAperture/mmRemoval characteristic
    FWHM/mmσ/mmMaximum removal rate/(nm·min-1)Effective etching diameter/mm
    1053.51.47318.88.4
    85.62.38325.411.1
    127.13.02330.616.3
    167.33.10352.820.0
    Table 1. Removal characteristic parameters of diaphragm in different apertures
    Optimization timesResidual peak to valley/nmResidual RMS/nmTotal residence time/min
    1184.712.66587.2
    2137.511.74539.3
    3119.811.51542.4
    Table 2. Modified optimization results
    Aperture/mmOptimal superimposed distance/mmMinimum residual peak-to-valley/nmRoot mean square/nmTotal residence time/min
    161.5σ16119.8011.50542.40
    121.5σ12108.589.66630.70
    81.4σ887.568.23744.53
    51.4σ576.424.631136.82
    Table 3. Simulation results of ion beam polishing of diaphragm at different apertures
    Le Kang, Shilei Jiang, Guobin Sun, Yuhao Zhang, Weiguo Liu. Simulation Study on Ion Beam Polishing with Changing Aperture by Diaphragm Method[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0810016
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