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    Journals >Acta Optica Sinica >Volume 7 >Issue 9 >Page 832 > Article
    • Acta Optica Sinica
    • Vol. 7, Issue 9, 832 (1987)
    Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method
    ZHEN SHUYIN1 and HAN LITING2
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  • 1[in Chinese]
  • 2[in Chinese]
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    ZHEN SHUYIN, HAN LITING. Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method[J]. Acta Optica Sinica, 1987, 7(9): 832 Copy Citation Text show less
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    ZHEN SHUYIN, HAN LITING. Calculation of electric fields inside multilayers by using a new thin-film characteristic matrix method[J]. Acta Optica Sinica, 1987, 7(9): 832
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