A new thin-film characteristic matrix, with which the relationship between the normal component of D and the tangential compo ent of E for TM wave of between the normal component of B and the tangential component of H for TE wave at the two boundaries of a layer can be described, is presented and used for calculation of electric field distributions inside multilayers. As a consequence, very simple expressions for the electric fields of TM and TE waves at any angle of incidence are obtained. The electric field distributions of a thin film polarizer and an induced reflection fi] k-r are calculated and plotted for illiustration of the new matrix method. It is also shown that the dispersive equation of surface polaritons on multilayers may easilybe derived by using this method.