SCM study on the 2D diffusion behavior of p-type impurities in planar InGaAs detectors

Shuai-Jun ZHANG; Tian-Xin LI; Wen-Jing WANG; Ju-Zhu LI; Xiu-Mei SHAO; Xue LI; Shi-You ZHENG; Yue-Peng PANG; Hui XIA

doi:10.11972/j.issn.1001-9014.2022.01.020

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