• Acta Optica Sinica
  • Vol. 41, Issue 14, 1412002 (2021)
Fuqian Li and Wenjing* Chen
Author Affiliations
  • Department of Optic-Electronic, College of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610065, China
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    DOI: 10.3788/AOS202141.1412002 Cite this Article Set citation alerts
    Fuqian Li, Wenjing* Chen. Phase Error Analysis and Correction for Phase Shifting Profilometry Using Crossed Grating[J]. Acta Optica Sinica, 2021, 41(14): 1412002 Copy Citation Text show less
    References

    [1] Lu M T, Su X Y. Vertical measurement method for structured light three-dimensional profilometry based on phase-shifting and modulation ratio[J]. Chinese Journal of Lasers, 46, 0704003(2019).

    [2] Zuo C, Feng S J, Huang L et al. Phase shifting algorithms for fringe projection profilometry: a review[J]. Optics and Lasers in Engineering, 109, 23-59(2018).

    [3] Cheng Z Y, Lu R S, Mao C L. Measurement method of three-dimensional shape of bright surface with binocular stereo vision[J]. Laser & Optoelectronics Progress, 57, 071202(2020).

    [4] Zhang S, Yau S T. Generic nonsinusoidal phase error correction for 3D shape measurement using a digital video projector[J]. Proceedings of SPIE, 6292, 62920R(2006).

    [5] Poynton C A. SMPTE tutorial: “Gamma” and its disguises: the nonlinear mappings of intensity in perception, CRTs, film, and video[J]. SMPTE Journal, 102, 1099-1108(1993).

    [6] Hoang T, Pan B, Nguyen D et al. Generic Gamma correction for accuracy enhancement in fringe-projection profilometry[J]. Optics Letters, 35, 1992-1994(2010).

    [7] Huang P S, Zhang C P, Chiang F P. High-speed 3-D shape measurement based on digital fringe projection[J]. Optical Engineering, 163-168(2003).

    [8] Liu K, Wang Y, Lau D L et al. Gamma model and its analysis for phase measuring profilometry[J]. Journal of the Optical Society of America A, Optics, Image Science, and Vision, 27, 553-562(2010).

    [9] Song Z. Comparative study on passive and active projector nonlinear Gamma calibration[J]. Applied Optics, 54, 3834-3841(2015).

    [10] Guo H W, He H T, Chen M Y. Gamma correction for digital fringe projection profilometry[J]. Applied Optics, 43, 2906-2914(2004).

    [11] Yu X, Liu Y K, Liu N Y et al. Flexible gamma calculation algorithm based on probability distribution function in digital fringe projection system[J]. Optics Express, 27, 32047-32057(2019).

    [12] Wu G X, Wu Y X, Hu X L et al. Exponential Taylor Series Method to eliminate the Gamma distortion in phase shifting profilometry[J]. Optics Communications, 452, 306-312(2019).

    [13] Baker M J, Xi J, Chicharo J F. Elimination of Gamma non-linear luminance effects for digital video projection phase measuring profilometers[C]∥4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), January 23-25, 2008, Hong Kong, China., 496-501(2008).

    [14] Cai W J, Cao Y P, Fu G K et al. A full-field compensation method for nonlinear phase error[J]. Acta Optica Sinica, 39, 0312001(2019).

    [15] Huang P S, Hu Q J, Chiang F P. Double three-step phase-shifting algorithm[J]. Applied Optics, 41, 4503-4509(2002).

    [16] Mao C L, Lu R S. Inverse error compensation method for improvement of phase recovery accuracy of multi-frequency fringe projection[J]. Acta Optica Sinica, 38, 0412005(2018).

    [17] Cai Z W, Liu X L, Jiang H et al. Flexible phase error compensation based on Hilbert transform in phase shifting profilometry[J]. Optics Express, 23, 25171-25181(2015).

    [18] Pan B, Qian K M, Huang L et al. Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry[J]. Optics Letters, 34, 416-418(2009).

    [19] Stetson K A, Brohinsky W R. Electrooptic holography and its application to hologram interferometry[J]. Applied Optics, 24, 3631-3637(1985).

    [20] Hyun J S, Zhang S. High-speed three-dimensional absolute shape measurement with three projected binary patterns[J]. Optical Engineering, 59, 024104(2020).

    [21] Zhang Q C, Wu Z J. Three-dimensional imaging technique based on Gray-coded structured illumination[J]. Infrared and Laser Engineering, 49, 0303004(2020).

    [22] Liu Y K, Olesch E, Yang Z et al. A one-dimensional phase-shift technique based on dual-frequency crossed fringe for phase measuring deflectometry[J]. Chinese Journal of Lasers, 42, 0308005(2015).

    [23] Liu Y K. Study on key technology and application of phase measuring deflectometry[D]. Chengdu: Sichuan University, 21-33(2008).

    [24] Xiao C, Chen F, Zhong M et al. Generation method of inverse fringes based on Delaunay triangulation[J]. Acta Optica Sinica, 36, 0712001(2016).

    [25] Su X Y, Chen W J. Reliability-guided phase unwrapping algorithm: a review[J]. Optics and Lasers in Engineering, 42, 245-261(2004).

    [26] Han Y, Zhang Q C, Wu Y S. Performance comparison of three basic phase unwrapping algorithms and their hybrid algorithms[J]. Acta Optica Sinica, 38, 0815006(2018).

    [27] Baker M J, Chicharo J F, Xi J. An investigation into temporal gamma luminance for digital fringe Fourier transform profilometers[C]∥2007 IEEE International Symposium on Intelligent Signal Processing, October 3-5, 2007, Alcala de Henares, Spain., 1-6(2007).

    Fuqian Li, Wenjing* Chen. Phase Error Analysis and Correction for Phase Shifting Profilometry Using Crossed Grating[J]. Acta Optica Sinica, 2021, 41(14): 1412002
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