• Laser & Optoelectronics Progress
  • Vol. 60, Issue 6, 0629001 (2023)
Chunshuai Fu1、2, Lü Qieni1、2、*, Hao Liu1、2, and Taiyu Liu1、2
Author Affiliations
  • 1School of Precision Instrument & Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of Opto-Electronics Information Technology, Ministry of Education, Tianjin University, Tianjin 300072, China
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    DOI: 10.3788/LOP212913 Cite this Article Set citation alerts
    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001 Copy Citation Text show less
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    [15] Lü Q N, Lü T, Jin W H et al. Analysis of measurable size range and its measuring accuracy of particle in interferometric particle imaging system[J]. Chinese Journal of Lasers, 40, 0508006(2013).

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    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001
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