• Laser & Optoelectronics Progress
  • Vol. 60, Issue 6, 0629001 (2023)
Chunshuai Fu1、2, Lü Qieni1、2、*, Hao Liu1、2, and Taiyu Liu1、2
Author Affiliations
  • 1School of Precision Instrument & Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of Opto-Electronics Information Technology, Ministry of Education, Tianjin University, Tianjin 300072, China
  • show less
    DOI: 10.3788/LOP212913 Cite this Article Set citation alerts
    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001 Copy Citation Text show less

    Abstract

    This study experimentally investigates the maximum measurable particle size of interferometric particle imaging (IPI). The maximum measurable particle size for IPI was examined in relation to the effect of object distance variation brought on by several object planes in the same field of vision. The IPI experimental system irradiated by a single beam was built to measure the polystyrene mixed particle fields with particle diameter of 51 μm and 110 μm, and the maximum measurable particle size in different collection areas in the same field of view was analyzed. The outcomes of the experiment demonstrate that the spatial relationship between the objects in the experimental system has an impact on the maximum quantifiable particle size of IPI technology. The maximum quantifiable particle size of various acquisition areas within the same field of view varies for an experimental system with fixed parameters.
    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001
    Download Citation