• Laser & Optoelectronics Progress
  • Vol. 60, Issue 6, 0629001 (2023)
Chunshuai Fu1、2, Lü Qieni1、2、*, Hao Liu1、2, and Taiyu Liu1、2
Author Affiliations
  • 1School of Precision Instrument & Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of Opto-Electronics Information Technology, Ministry of Education, Tianjin University, Tianjin 300072, China
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    DOI: 10.3788/LOP212913 Cite this Article Set citation alerts
    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001 Copy Citation Text show less
    Principle of IPI
    Fig. 1. Principle of IPI
    Variation curve of measurable particle size range with object distance. (a) Curve of maximum measurable particle size with object distance; (b) curve of minimum measurable particle size with object distance
    Fig. 2. Variation curve of measurable particle size range with object distance. (a) Curve of maximum measurable particle size with object distance; (b) curve of minimum measurable particle size with object distance
    Experimental system and result analysis. (a) Principle of experimental system; (b) fringe images collected by experimental system; (c) function between defocusing distance g and ∆l
    Fig. 3. Experimental system and result analysis. (a) Principle of experimental system; (b) fringe images collected by experimental system; (c) function between defocusing distance g and ∆l
    Images in different fields of view of IPI system. (a) 435.9 mm≤zozo≤435.9 mm; (c)light intensity of P=0 and P=1, d=51 μm and d=110 μm
    Fig. 4. Images in different fields of view of IPI system. (a) 435.9 mm≤zo<442.1 mm; (b) zo≤435.9 mm; (c)light intensity of P=0 and P=1, d=51 μm and d=110 μm
    Processing results of fringe. (a) (b) M1 particle and N1 particle in Fig. 4 (a); (c) particle M2 in Fig. 4 (b)
    Fig. 5. Processing results of fringe. (a) (b) M1 particle and N1 particle in Fig. 4 (a); (c) particle M2 in Fig. 4 (b)
    Chunshuai Fu, Lü Qieni, Hao Liu, Taiyu Liu. Upper Limit Analysis of Measurable Particle Size by Interferometric Particle Imaging Technology[J]. Laser & Optoelectronics Progress, 2023, 60(6): 0629001
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