Heavy Ion Single Event Effect Test Calibration System

Haolin Liu; Qing Liu; Xiaohui Zhang; Jing Sun; Song Gu; Zhengyu Zhong

doi:10.3788/LOP202158.1732001

[1] Harboe-Sorensen R, Guerre F X, Design Roseng A.. testing and calibration of a “reference SEU monitor” system[C], 9812502(2005).

[2] Harboe-Sorensen R, Poivey C, Guerre F X et al. From the reference SEU monitor to the technology demonstration module on-board PROBA-II[J]. IEEE Transactions on Nuclear Science, 55, 3082-3087(2008).

[3] Harboe-Sorensen R, Poivey C, Zaden A et al. Proba-Ⅱ technology demonstration module in-flight data analysis[C], 581-586(2011).

[4] Shen D J, Fan H, Guo G et al. Single event effect calibration experiment with ESA single event upset monitor on Beijing HI-13 tandem accelerator[J]. Atomic Energy Science and Technology, 51, 555-560(2017).

[5] Luo Y H, Guo X Q, Chen W et al. Energy and angular dependence of single event upsets in ESA SEU Monitor[J]. Acta Physica Sinica, 65, 206103(2016).

[6] Hu Z L, Yang W T, Li Y H et al. Atmospheric neutron single event effect in 65 nm microcontroller units by using CSNS-BL09[J]. Acta Physica Sinica, 68, 238502(2019).

[7] Yu Y T, Chen Y B, Shui C S et al. Test study of single event effects on large capacity radiation-hardened SRAMs[J]. Spacecraft Environment Engineering, 35, 462-467(2018).

[8] Gao D Q, Zhou Z Z, Wu F J et al. R & D progress of HIAF power supply system[J]. Atomic Energy Science and Technology, 53, 2048-2054(2019).

[9] Gao L J, Shi S T, Guo G et al. Technique of producing high charge state heavy-ion beam[J]. Atomic Energy Science and Technology, 48, 1304-1308(2014).

[10] Shen D J, Chen Q, Guo G et al. Error analysis of irradiation dose in single particle effect experiment of heavy ion[J]. Science and Technology Innovation Herald, 16, 112-114, 116(2019).

[11] Duan Y H, Cong M Y, Jiang D Y et al. Spectral response cutoff wavelength of ZnO ultraviolet photodetector modulated by bias voltage[J]. Acta Optica Sinica, 40, 2004001(2020).

[12] Zhou D, Cao J, Jiang Y H et al. Speckle design method based on principal component analysis[J]. Laser & Optoelectronics Progress, 57, 201104(2020).

[13] Zhen Z, Hao R, Xing D et al. Nearly-ballistic optimization design of high-speed uni-traveling-carrier photodiodes[J]. Chinese Journal of Lasers, 47, 1006003(2020).