• Laser & Optoelectronics Progress
  • Vol. 58, Issue 17, 1732001 (2021)
Haolin Liu1、*, Qing Liu1, Xiaohui Zhang1, Jing Sun2, Song Gu2, and Zhengyu Zhong3
Author Affiliations
  • 1School of Automation and Information Engineering, Xi'an University of Technology, Xi'an , Shaanxi 710048, China
  • 2China Academy of Space Technology (Xi'an), Xi'an , Shaanxi 710100, China
  • 3Beijing San-talking Testing Engineering Academy, Beijing100089, China
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    DOI: 10.3788/LOP202158.1732001 Cite this Article Set citation alerts
    Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001 Copy Citation Text show less

    Abstract

    In response to the need for rapid calibration of the domestic accelerator beam and referring to the single event rollover monitor of European Space Agency, this paper successfully developed a heavy ion single event effect calibration system and successfully applied it to the domestic tandem heavy ion accelerator beam single event test calibration. The test results show that 11 kinds of heavy ions can be calibrated to the SEU (Single Event Upset) cross-section data of the system in the "00" and "FF" data modes under the irradiation angles of 0°, 45° and 60°, respectively. By comparing with the results of single-event flipping test data of major accelerators at home and abroad, the physical distribution of single-event flipping inside the calibration system is analyzed, which verifies that the designed single-particle calibration system can accurately monitor the accuracy and uniformity of the heavy ion accelerator beam.
    Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001
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