Heavy Ion Single Event Effect Test Calibration System

Haolin Liu; Qing Liu; Xiaohui Zhang; Jing Sun; Song Gu; Zhengyu Zhong

doi:10.3788/LOP202158.1732001

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 17 >Page 1732001 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 17, 1732001 (2021)

Heavy Ion Single Event Effect Test Calibration System

Haolin Liu^1、*, Qing Liu¹, Xiaohui Zhang¹, Jing Sun², Song Gu², and Zhengyu Zhong³

Author Affiliations

¹School of Automation and Information Engineering, Xi'an University of Technology, Xi'an , Shaanxi 710048, China

²China Academy of Space Technology (Xi'an), Xi'an , Shaanxi 710100, China

³Beijing San-talking Testing Engineering Academy, Beijing100089, China

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DOI: 10.3788/LOP202158.1732001 Cite this Article Set citation alerts

Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001 Copy Citation Text

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Fig. 1. Structure of single event effect test calibration system

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Fig. 2. 4-chip storage structure of AT68166F chip

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Fig. 3. 8-region storage structure of AT60142F chip

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Fig. 4. Overall structure of heavy ion single particle calibration system

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Fig. 5. Heavy ion single particle calibration system plate

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Fig. 6. Flip distribution of C ion irradiation at different incident angles (test data is 00). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°

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Fig. 7. Flip distribution of C ion irradiation at different incident angles (test datas is FF). (a) Incident angle is 0; (b) incident angle is 45°; (c) incident angle is 60°

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Fig. 8. Single particle flip distribution of Kr ion irradiation. (a) Incident angle is 0, and test data is 00; (b) incident angle is 0, and test data is FF

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Module	Description
Serial control	Set serial port parameters
Serial receiving and sending	Send and receive data by serial port
Reading and writing	Write data to the disk and data stream mode read
Chart drawing	Draw curve graphs and scatter plots under XY coordinates
Error statistics	Compare with the initial vector and count the number of errors
Section calculation	Calculate the cross section
Write to vector	Send commands to the calibration system to achieve write operations to the target device
Read data	Send commands to the calibration system，the calibration system is used to read the target device data，and the PC is uesd to save the returned data
Current and voltage monitoring	Display the voltage and current data sent back
Input	Enter the radiation source information，including particle type，energy，etc.，and save it
Transfer	Inquire，select and other operations to obtain the entered radiation source information
Calibration system reference data display	Draw the reference data curve of the calibration system
Field data annotation	Calculate the field cross-section and standardize it in the graph
Addition，deletion，and modification	Manage the calibration data of the radiation source that has been verified to be correct，including data addition，deletion，and modification
Calibration data query	Inquire or display historical calibration data

Table 1. Functional design of software

Ion	Angle /（°）	LET /（MeV·cm²·mg^-1）	Data mode	Fluence rate /（cm^-2·s^-1）	Fluence /cm^-2	Experimentphenomenon	Wrong number	Cross section size per 1 bit /cm²
C	0	1.73	00	9.50×10³	1.00×10⁶	SEU	96	6.00×10^-12
C	0	1.73	FF	9.50×10³	1.00×10⁶	SEU	97	6.06×10^-12
C	45	2.45	00	9.50×10³	5.00×10⁵	SEU	96	1.20×10^-11
C	45	2.45	FF	9.50×10³	5.00×10⁵	SEU	71	8.88×10^-12
C	60	3.46	00	9.50×10³	2.50×10⁵	SEU	177	4.43×10^-11
C	60	3.46	FF	9.50×10³	2.50×10⁵	SEU	126	3.15×10^-11
F	0	4.70	FF	1.10×10⁴	1.00×10⁶	SEU	115689	7.23×10^-9
F	0	4.70	00	1.10×10⁴	1.00×10⁵	SEU	13453	8.41×10^-9
F	0	4.70	FF	4.80×10³	1.00×10⁵	SEU	11983	7.49×10^-9
F	45	6.60	00	4.80×10³	5.00×10⁴	SEU	8834	1.10×10^-8
F	45	6.60	FF	4.80×10³	5.00×10⁴	SEU	7837	9.80×10^-9
F	60	9.40	00	4.80×10³	2.50×10⁴	SEU	5923	1.48×10^-8
F	60	9.40	FF	4.80×10³	2.50×10⁴	SEU	5788	1.45×10^-8
I	0	65.60	00	5.00×10²	1.00×10⁴	SEU	10466	6.54×10^-8
I	0	65.60	FF	5.00×10²	1.00×10⁴	SEU	7053	4.41×10^-8
I	45	92.80	00	5.00×10²	5.00×10³	SEU	5077	6.35×10^-8
I	45	92.80	FF	5.00×10²	5.00×10³	SEU	4182	5.23×10^-8
I	60	131.20	00	5.00×10²	5.00×10³	SEU	5284	6.61×10^-8
I	60	131.20	FF	1.00×10³	5.00×10³	SEU	4917	6.15×10^-8
Li	0	0.44	00	2.30×10⁴	2.00×10⁶	SEU	17	5.31×10^-13
Li	0	0.44	FF	2.30×10⁴	2.00×10⁶	SEU	16	5.00×10^-13
Li	45	0.62	00	2.30×10⁴	1.00×10⁶	SEU	7	4.38×10^-13
Li	45	0.62	FF	2.30×10⁴	1.00×10⁶	SEU	6	3.75×10^-13
Li	60	0.88	00	2.30×10⁴	5.00×10⁵	SEU	3	3.75×10^-13
Li	60	0.88	FF	2.30×10⁴	5.00×10⁵	SEU	7	8.75×10^-13
O	0	3.10	00	1.30×10³	1.00×10⁵	SEU	1290	8.06×10^-10
O	0	3.10	FF	1.30×10³	1.00×10⁵	SEU	617	3.86×10^-10
O	0	3.10	FF	1.30×10³	1.00×10⁵	SEU	505	3.16×10^-10
O	45	4.40	00	1.30×10³	1.00×10⁵	SEU	11811	7.38×10^-9
O	45	4.40	FF	1.30×10³	1.00×10⁵	SEU	6275	3.92×10^-9
O	60	6.20	00	1.30×10³	1.00×10⁵	SEU	13704	8.57×10^-9
O	60	6.20	FF	1.30×10³	1.00×10⁵	SEU	11295	7.06×10^-9
Si	0	9.00	00	3.90×10²	5.00×10⁴	SEU	22008	2.75×10^-8
Si	0	9.00	FF	3.90×10²	5.00×10⁴	SEU	17522	2.19×10^-8
Si	45	12.70	00	3.90×10²	5.00×10⁴	SEU	26423	3.30×10^-8
Si	45	12.70	FF	3.90×10²	3.00×10⁴	SEU	19059	3.97×10^-8
Si	60	18.00	00	3.90×10²	3.00×10⁴	SEU	17114	3.57×10^-8
Si	60	18.00	FF	3.90×10²	3.00×10⁴	SEU	16832	3.51×10^-8
Ge	0	37.30	00	2.50×10⁴	1.50×10⁶	SEU	746791	3.11×10^-8
Ge	0	37.30	FF	1.35×10⁴	8.10×10⁵	SEU	338616	2.61×10^-8
Ge	0	37.30	00	1.28×10³	7.70×10⁴	SEU	38440	3.12×10^-8
Ge	0	37.30	FF	1.42×10³	8.50×10⁴	SEU	38048	2.80×10^-8
Ti	0	21.84	00	1.90×10³	1.20×10⁵	SEU	32736	1.70×10^-8
Ti	0	21.84	FF	1.80×10³	1.10×10⁵	SEU	29474	1.70×10^-8
Cl	0	13.40	00	1.70×10³	1.00×10⁵	SEU	23844	1.50×10^-8
Cl	0	13.40	FF	5.00×10²	3.00×10⁴	SEU	6816	1.42×10^-8
Ta	0	81.35	00	1.01×10⁴	1.01×10⁶	SEU	78848	6.19×10^-8
Kr	0	20.30	FF	2.50×10⁴	1.01×10⁶	SEU	22010	1.31×10^-8
Kr	0	20.30	00	2.50×10⁴	1.01×10⁶	SEU	22824	1.35×10^-8

Table 2. Summary of single particle irradiation test data^[7-8]

Ion	This paper		CIAE			ESA
Ion	LET /（MeV·cm²·mg^-1）	Cross section size per 1 bit /cm^2①	LET /（MeV·cm²·mg^-1）	Cross section size per 1 bit /cm²	Error /%	LET /（MeV·cm²·mg^-1）^②	Cross section size per 1 bit /cm^2②	Error /%
Li	0.44	5.16×10^-13	—	—	—	—	—	—
Li	0.62^③	4.07×10^-13	—	—	—	—	—	—
Li	0.88^④	6.25×10^-13	—	—	—	—	—	—
C	1.73	6.03×10^-12	1.8	4.90×10^-12	18.74	1.68^⑤	1.46×10^-11⑥	142.12
C	2.45^③	1.04×10^-11	2.5^③	1.00×10^-11	3.85	2.34^⑤	2.68×10^-11⑥	157.69
C	3.46^④	3.79×10^-11	3.6^④	4.67×10^-11	23.22	—	—	—
O	3.10	5.96×10^-10	—	—	—	3.03^⑤	9.42×10^-10⑥	58.05
O	4.40^③	5.65×10^-9	4.3	5.37×10^-9	4.96	4.55^⑤	4.54×10^-9⑥	19.65
O	6.20^④	7.82×10^-9	6.2^③	7.07×10^-9	9.59	6.29^⑤	7.11×10^-9⑥	9.08
F	4.70	7.95×10^-9	—	—	—	—	—	—
F	6.60^③	1.04×10^-8	—	—	—	—	—	—
F	9.40^④	1.47×10^-8	8.8^④	1.03×10^-8	29.93	9.97^⑤	1.53×10^-8⑥	4.08
Si	9.00	2.47×10^-8	—	—	—	—	—	—
Si	12.70^③	3.64×10^-8	—	—	—	13.86^⑤	1.98×10^-8⑥	45.60
Si	18.00^④	3.54×10^-8	—	—	—	20.34^⑤	2.39×10^-8⑥	32.49
Cl	13.40	1.46×10^-8	13.8	1.93×10^-8	—	—	—	—
Kr	20.30	1.34×10^-8	20.9	2.30×10^-8	71.60	—	—	—
Ti	21.84	1.70×10^-8	20.9	2.30×10^-8	35.30	—	—	—
Ge	37.00	2.28×10^-8	33.5	3.14×10^-8	37.70	—	—	—
Ge	37.30	2.91×10^-8	33.5	3.14×10^-8	7.90	—	—	—
Ge	52.30^③	3.28×10^-8	—	—	—	—	—	—
I	65.60	5.48×10^-8	67.4^④	4.99×10^-8	8.94	64.40^⑤	6.79×10^-8⑥	23.91
Ta	81.35	6.19×10^-8	—	—	—	—	—	—
Ta	92.80^③	5.79×10^-8	—	—	—	—	—	—
Ta	131.20^④	6.38×10^-8	—	—	—	111.92^⑤	1.08×10^-7⑥	69.28

Table 3. Comparison of single particle flip cross section data

Haolin Liu, Qing Liu, Xiaohui Zhang, Jing Sun, Song Gu, Zhengyu Zhong. Heavy Ion Single Event Effect Test Calibration System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1732001

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