• Acta Optica Sinica
  • Vol. 42, Issue 1, 0112001 (2022)
Binghua Cao1、*, Dedong Zheng1, Mengbao Fan2, Fengshan Sun2, and Lin Liu3
Author Affiliations
  • 1School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, Jiangsu 221000, China
  • 2School of Mechatronic Engineering, China University of Mining and Technology, Xuzhou, Jiangsu 221000, China
  • 3Beijing Institute of Aerospace Metrology and Measurement Technology, Beijing 100076, China
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    DOI: 10.3788/AOS202242.0112001 Cite this Article Set citation alerts
    Binghua Cao, Dedong Zheng, Mengbao Fan, Fengshan Sun, Lin Liu. Efficient and Reliable Thickness Measurement Method for Multilayer Coatings Based on Terahertz Time-Domain Spectroscopy Technology[J]. Acta Optica Sinica, 2022, 42(1): 0112001 Copy Citation Text show less
    Schematic of THz wave propagation in a single-layer model
    Fig. 1. Schematic of THz wave propagation in a single-layer model
    Schematic of multi-layer structure deriving equivalent reflection coefficient
    Fig. 2. Schematic of multi-layer structure deriving equivalent reflection coefficient
    Comparison of ergodicity between standard Kent chaotic map and improved Kent chaotic map
    Fig. 3. Comparison of ergodicity between standard Kent chaotic map and improved Kent chaotic map
    Flow chart of adaptive TLBO algorithm
    Fig. 4. Flow chart of adaptive TLBO algorithm
    Flow chart of thickness measured by model method
    Fig. 5. Flow chart of thickness measured by model method
    THz-TDS diagram
    Fig. 6. THz-TDS diagram
    Schematic of THz-TDS principle
    Fig. 7. Schematic of THz-TDS principle
    Schematic of multilayer samples. (a) Single-layer paper sheet fixed on the metallic substrate; (b) double-layer paper sheet fixed on the metallic substrate
    Fig. 8. Schematic of multilayer samples. (a) Single-layer paper sheet fixed on the metallic substrate; (b) double-layer paper sheet fixed on the metallic substrate
    TBC. (a) Surface morphology of top coating; (b) structure diagram; (c) electron microscope image
    Fig. 9. TBC. (a) Surface morphology of top coating; (b) structure diagram; (c) electron microscope image
    THz measurement signal. (a) Sample 1; (b) sample 2
    Fig. 10. THz measurement signal. (a) Sample 1; (b) sample 2
    Comparison of fitness between adaptive TLBO algorithm, standard TLBO, and global search in Ref. [20]
    Fig. 11. Comparison of fitness between adaptive TLBO algorithm, standard TLBO, and global search in Ref. [20]
    Comparison of measurement signal and simulation signal. (a) Sample 1; (b) sample 2
    Fig. 12. Comparison of measurement signal and simulation signal. (a) Sample 1; (b) sample 2
    Signal of TBC sample. (a) THz measurement signal of TBC; (b) comparison of measurement signal and simulation signal of TBC
    Fig. 13. Signal of TBC sample. (a) THz measurement signal of TBC; (b) comparison of measurement signal and simulation signal of TBC
    SampleNumber of experimentsNumber of times which adaptive TLBO algorithm has workedEffectiveness /%Run time /s
    Sample 150428448.3
    Sample 250459049.7
    Table 1. Adaptive TLBO algorithm functioning statistics table
    LayerRefractive indexExtinction coefficientActual thickness /μmMeasured thickness /μmRelative error /%
    Layer 11.440.04892±1.192.5±1.480.54
    Layer 2Unknown116.8
    Table 2. Measurement parameters of sample 1 under the adaptive TLBO algorithm
    LayerRefractive indexExtinction coefficientActual thickness /μmMeasured thickness /μmRelative error /%
    Layer 11.450.04892±1.193.3±1.611.41
    Layer 2Unknown103.8
    Layer 31.460.05092±1.193.3±1.541.41
    Layer 4Unknown129.6
    Table 3. Measurement parameters of sample 2 under the adaptive TLBO algorithm
    LayerActual thickness /μmTLBOAdaptive TLBOMethod in Ref. [20]
    Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%
    Layer 192±1.194.2±1.682.3992.5±1.480.5492.7±1.550.76
    Layer 2Unknown113.1116.8118.9
    Table 4. Thickness results of sample 1 under the three algorithms
    LayerActual thickness /μmTLBOAdaptive TLBOMethod in Ref. [20]
    Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%
    Layer 192±1.194.4±1.842.6193.3±1.611.4193.4±1.661.52
    Layer 2Unknown104.5103.8103.1
    Layer 392±1.194.8±1.713.0493.3±1.541.4193.3±1.621.41
    Layer 4Unknown128.4129.6130.4
    Table 5. Thickness results of sample 2 under the three algorithms
    SampleTLBOAdaptive TLBOMethod in Ref. [20]
    Sample 140.448.3118.3
    Sample 240.649.7119.1
    Table 6. Time consumption of the three algorithms in a single rununit: s
    SampleActual thickness /μmTLBOAdaptive TLBOMethod in Ref. [20]
    Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%Measured thickness /μmRelative error /%
    TBC305.3312.2±1.772.26301.1±1.521.38300.4±1.561.60
    Table 7. Results of TBC’s thickness under the three algorithms
    SampleRefractive indexExtinction coefficientActual thickness /μmMeasured thickness /μmRelative error of thickness /%
    TC4.900.072305.3301.1±1.521.38
    Table 8. Measurement parameters of TC under the adaptive TLBO algorithm
    SampleTLBOAdaptive TLBOMethod in Ref. [20]
    TBC40.146.2114.8
    Table 9. Single running time of three different algorithms for TBCunit: s
    Binghua Cao, Dedong Zheng, Mengbao Fan, Fengshan Sun, Lin Liu. Efficient and Reliable Thickness Measurement Method for Multilayer Coatings Based on Terahertz Time-Domain Spectroscopy Technology[J]. Acta Optica Sinica, 2022, 42(1): 0112001
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