• Laser & Optoelectronics Progress
  • Vol. 59, Issue 2, 0212001 (2022)
Jinrui Gao1, Dahai Li1、2、*, Heng Lai1, Xinwei Zhang1, Ruiyang Wang1, and Yilang Ruan1
Author Affiliations
  • 1College of Electronics and Information Engineering, Sichuan University, Chengdu , Sichuan 610065, China
  • 2College of Aeronautics and Astronautics, Sichuan University, Chengdu , Sichuan 610065, China
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    DOI: 10.3788/LOP202259.0212001 Cite this Article Set citation alerts
    Jinrui Gao, Dahai Li, Heng Lai, Xinwei Zhang, Ruiyang Wang, Yilang Ruan. Measurement of Wavefront Aberration of Lens Based on Phase Measuring Deflectometry[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0212001 Copy Citation Text show less
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    Jinrui Gao, Dahai Li, Heng Lai, Xinwei Zhang, Ruiyang Wang, Yilang Ruan. Measurement of Wavefront Aberration of Lens Based on Phase Measuring Deflectometry[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0212001
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