Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique

Jianyang Feng; Haiyun Chen; Chu Shi; Gaoming Liu; Xiang Yan

doi:10.3788/LOP56.221202

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 22 >Page 221202 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 22, 221202 (2019)

Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique

Jianyang Feng, Haiyun Chen^*, Chu Shi, Gaoming Liu, and Xiang Yan

Author Affiliations

School of Electrical Engineering and Information, Southwest Petroleum University, Chengdu, Sichuan 610500, China

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DOI: 10.3788/LOP56.221202 Cite this Article Set citation alerts

Jianyang Feng, Haiyun Chen, Chu Shi, Gaoming Liu, Xiang Yan. Three-Dimensional Measurement of Highly-Reflective Surface Using Structured Light Technique[J]. Laser & Optoelectronics Progress, 2019, 56(22): 221202 Copy Citation Text

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