• Chinese Optics Letters
  • Vol. 13, Issue 4, 041102 (2015)
Pin Cao, Yongying Yang*, Chen Li, Huiting Chai..., Yang Li, Shibin Xie and Dong Liu|Show fewer author(s)
Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China
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    DOI: 10.3788/COL201513.041102 Cite this Article Set citation alerts
    Pin Cao, Yongying Yang, Chen Li, Huiting Chai, Yang Li, Shibin Xie, Dong Liu, "Alignment methods for micron-scale surface defects automatic evaluation of large-aperture fine optics," Chin. Opt. Lett. 13, 041102 (2015) Copy Citation Text show less
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    [4] Xin Liang, Zhen Bai, Jingsong Wei. Movement flatness error measurement based on an astigmatic method. Applied Optics, 56, 4347(2017).

    Pin Cao, Yongying Yang, Chen Li, Huiting Chai, Yang Li, Shibin Xie, Dong Liu, "Alignment methods for micron-scale surface defects automatic evaluation of large-aperture fine optics," Chin. Opt. Lett. 13, 041102 (2015)
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