High Quality Fringe Patterns Captured from Phase Measuring Deflectometry

Huimin Yue; Rong Li; Zhipeng Pan; Hongli Chen; Yuxiang Wu; Yong Liu

doi:10.3788/AOS201737.1112004

Journals >Acta Optica Sinica >Volume 37 >Issue 11 >Page 1112004 > Article

Acta Optica Sinica
Vol. 37, Issue 11, 1112004 (2017)

High Quality Fringe Patterns Captured from Phase Measuring Deflectometry

Huimin Yue^*, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, and Yong Liu

Author Affiliations

College of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China

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DOI: 10.3788/AOS201737.1112004 Cite this Article Set citation alerts

Huimin Yue, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, Yong Liu. High Quality Fringe Patterns Captured from Phase Measuring Deflectometry[J]. Acta Optica Sinica, 2017, 37(11): 1112004 Copy Citation Text

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Huimin Yue, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, Yong Liu. High Quality Fringe Patterns Captured from Phase Measuring Deflectometry[J]. Acta Optica Sinica, 2017, 37(11): 1112004

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