The random error introduced by CCD camera and the nonlinear error caused by the nonlinear response function of illuminant and CCD camera are two main errors in phase measuring deflectometry. Based on the analysis of the factors affecting the phase error, we establish the analysis model of fringe pattern quality and the factors such as phase error, F value of camera lens, the period of coded fringe pattern, and modulation. The reliability and correctness of the proposed model are verified by computer simulation and experiment. The results of theoretical analysis, simulation, and experimental results show that the contrast ratio of the obtained fringe pattern is proportional to F value of the camera lens and the period and the modulation of the fringe pattern. The sinuousness of fringe is inversely proportional to F value of the camera lens and the period and the modulation of the generated fringe pattern. According to the proposed fringe quality analysis model, high quality fringe pattern can be obtained by optimizing the system parameters. The proposed model can apply to other techniques, such as surface-structured light three-dimensional measurement.