• Chinese Optics Letters
  • Vol. 18, Issue 8, 083101 (2020)
Liangyi Hang*, Weiguo Liu**, and Junqi Xu
Author Affiliations
  • Shaanxi Provincial Key Laboratory of Thin Films Technology and Optical Test, Xi’an Technological University, Xi’an 710021, China
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    DOI: 10.3788/COL202018.083101 Cite this Article Set citation alerts
    Liangyi Hang, Weiguo Liu, Junqi Xu. Effects of various substrate materials on structural and optical properties of amorphous silicon nitride thin films deposited by plasma-enhanced chemical vapor deposition[J]. Chinese Optics Letters, 2020, 18(8): 083101 Copy Citation Text show less
    Schematic of RF-PECVD coating system used in this study.
    Fig. 1. Schematic of RF-PECVD coating system used in this study.
    XRD patterns of SiNx thin films formed by PECVD method on (a) Si and (b) glass and fused silica (FS).
    Fig. 2. XRD patterns of SiNx thin films formed by PECVD method on (a) Si and (b) glass and fused silica (FS).
    High-resolution XPS spectra of SiNx films formed on Si, glass (G), and FS substrates: (a) Si 2p spectra; (b) N 1s spectra.
    Fig. 3. High-resolution XPS spectra of SiNx films formed on Si, glass (G), and FS substrates: (a) Si 2p spectra; (b) N 1s spectra.
    Optical constants of SiNx films formed on different substrates: (a) refractive index; (b) extinction coefficient.
    Fig. 4. Optical constants of SiNx films formed on different substrates: (a) refractive index; (b) extinction coefficient.
    Deposition rates and physical thicknesses of SiNx films deposited on various substrates.
    Fig. 5. Deposition rates and physical thicknesses of SiNx films deposited on various substrates.
    Transmittances of SiNx films: (a) SiNx2 on glass; (b) SiNx3 on FS.
    Fig. 6. Transmittances of SiNx films: (a) SiNx2 on glass; (b) SiNx3 on FS.
    SamplesSilicon (%)Nitrogen (%)Uncertainty (%)
    SiNx14852±4
    SiNx24654±4
    SiNx34654±4
    Table 1. Relative Atomic Concentrations of Si and N of SiNx Films Deposited on Various Substrates, Obtained by XPS
    No.TetrahedronBonding UnitEBa (eV) of Si 2p
    1SiSi3NSi3N100.30
    2SiSi2N2Si3N2101.00
    3SiSiN3SiN101.70
    4SiN4Si3N4102.40
    Table 2. Binding Energies of All the Possible Chemical Bonds in Regions Si 2p
    Liangyi Hang, Weiguo Liu, Junqi Xu. Effects of various substrate materials on structural and optical properties of amorphous silicon nitride thin films deposited by plasma-enhanced chemical vapor deposition[J]. Chinese Optics Letters, 2020, 18(8): 083101
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