• Laser & Optoelectronics Progress
  • Vol. 56, Issue 14, 141501 (2019)
Xianming Xiong1、2、*, Hongqiang Shi1, and Xingyu Zeng1
Author Affiliations
  • 1 School of Electrical Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, China
  • 2 Key Laboratory of Optoelectronics Information Processing for Guangxi Universities, Guilin, Guangxi 541004, China
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    DOI: 10.3788/LOP56.141501 Cite this Article Set citation alerts
    Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501 Copy Citation Text show less
    References

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    Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501
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