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Journals >
Laser & Optoelectronics Progress >
Volume 56 >
Issue 14 >
Page 141501 > Article
Laser & Optoelectronics Progress
Vol. 56, Issue 14, 141501 (2019)
Surface Defect Detectionon Polished Surface Based on Reflection Moiré
Xianming Xiong
1、2、*
, Hongqiang Shi
1
, and Xingyu Zeng
1
Author Affiliations
1
School of Electrical Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, China
2
Key Laboratory of Optoelectronics Information Processing for Guangxi Universities, Guilin, Guangxi 541004, China
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DOI:
10.3788/LOP56.141501
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Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501
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Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501
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Paper Information
Category: Machine Vision
Received: Dec. 18, 2018
Accepted: Feb. 17, 2019
Published Online: Jul. 11, 2019
The Author Email: Xiong Xianming (5311128@qq.com)
DOI:
10.3788/LOP56.141501
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