• Journal of Infrared and Millimeter Waves
  • Vol. 39, Issue 5, 619 (2020)
Chen-Chen ZHANG1、2, Hai-Yang MAO2、3、*, Le-Le BAI4, Ji-Jun XIONG1, Wei-Bing WANG2, and Da-Peng CHEN2、3
Author Affiliations
  • 1North University of China, Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, Shanxi Provincial Key Laboratory of Dynamic Testing Technology, Taiyuan030051, China
  • 2Institute of Microelectronics of Chinese Academy of Sciences, Beijing100029, China
  • 3Advanced Sensing Department, Wuxi Internet of Things Innovation Center Co. Ltd., Wuxi214001, China
  • 4State key laboratory of Quantum Optics and Quantum Optics Devices, Shanxi University, Taiyuan030006, China
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    DOI: 10.11972/j.issn.1001-9014.2020.05.013 Cite this Article
    Chen-Chen ZHANG, Hai-Yang MAO, Le-Le BAI, Ji-Jun XIONG, Wei-Bing WANG, Da-Peng CHEN. A response time measurement method for MEMS IR detectors[J]. Journal of Infrared and Millimeter Waves, 2020, 39(5): 619 Copy Citation Text show less
    References

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    Chen-Chen ZHANG, Hai-Yang MAO, Le-Le BAI, Ji-Jun XIONG, Wei-Bing WANG, Da-Peng CHEN. A response time measurement method for MEMS IR detectors[J]. Journal of Infrared and Millimeter Waves, 2020, 39(5): 619
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