Correlation between MBE deoxidation conditions and InGaAs/InP APD performance

Zi-Lu GUO; Wen-Juan WANG; Hui-Dan QU; Liu--Yan FAN; Yi-Cheng ZHU; Ya-Jie WANG; Chang-Lin ZHENG; Xing-Jun WANG; Ping-Ping CHEN; Wei LU

doi:10.11972/j.issn.1001-9014.2024.01.009

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