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    Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 10 >Page 100002 > Article
    • Laser & Optoelectronics Progress
    • Vol. 57, Issue 10, 100002 (2020)
    Review of Multi-Wavelength Digital Holography Metrology
    Yuemeng Zhang, Ping Cai*, Jun Long, and Hao Yan
    Author Affiliations
  • School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
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    DOI: 10.3788/LOP57.100002 Cite this Article Set citation alerts
    Yuemeng Zhang, Ping Cai, Jun Long, Hao Yan. Review of Multi-Wavelength Digital Holography Metrology[J]. Laser & Optoelectronics Progress, 2020, 57(10): 100002 Copy Citation Text show less
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    Article index updated: May. 19, 2024
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    Yuemeng Zhang, Ping Cai, Jun Long, Hao Yan. Review of Multi-Wavelength Digital Holography Metrology[J]. Laser & Optoelectronics Progress, 2020, 57(10): 100002
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