Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai; Jiaojie Huang; Hang Zhao; Jinsong Li; Qinghua Lü; Xuanze Wang

doi:10.3788/LOP57.031202

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 3 >Page 031202 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 3, 031202 (2020)

Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai^1、*, Jiaojie Huang¹, Hang Zhao¹, Jinsong Li¹, Qinghua Lü², and Xuanze Wang¹

Author Affiliations

¹Hubei Key Laboratory of Modern Manufacturing Quantity Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China

²School of Science, Hubei University of Technology, Wuhan, Hubei 430068, China

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DOI: 10.3788/LOP57.031202 Cite this Article Set citation alerts

Zhongsheng Zhai, Jiaojie Huang, Hang Zhao, Jinsong Li, Qinghua Lü, Xuanze Wang. Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031202 Copy Citation Text

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