Contents
2023
Volume: 60 Issue 3
26 Article(s)

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Instrumentation, Measurement and Metrology
[in Chinese]
Jiubin Tan
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312001 (2023)
Mechanical Testing Theory and Technology: Present Situation, Trends, and Prospects
Xin Ye, Shiyuan Liu, Jigui Zhu, Zhiquan Huang, Jinlong Zhu, Yinan Lai, Hongyan Miao, and Qidong Wang
Mechanical measurement theory and technology is the main process to obtain mechanical physical information, and the booster to promote the progress of industrial production and manufacturing technology. With China's gradual upgrade from capital- and labor-intensive industries to knowledge-intensive industries, stra
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312002 (2023)
Patterned Wafer Defect Inspection at Advanced Technology Nodes
Jiamin Liu, Hang Zhao, Qizhe Wu, Xianrui Feng, Xiangyu Zhao, Zhenyang Zhang, Chumiao Zhang, Tao Huang, Jinlong Zhu, and Shiyuan Liu
With the ever-increasing demand for sub-10 nm integrated circuit chips in the fields such as consumer electronics, interconnect hardware, and electronic medical equipment, the impact of wafer defects introduced by semiconductor manufacturing equipment on the yield and price of integrated circuits will continue to emerg
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312003 (2023)
Research Progress of High Precision Measurement Technology in Large Aircraft Assembly
Kaifu Zhang, Yue Shi, Bin Luo, Changxin Tong, Ting Pan, and Mu Qiao
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312004 (2023)
Laser Interferometric Multi-Degree-of-Freedom Measurement Technology in Space Gravitational-Wave Detection
Xin Xu, Yidong Tan, Henglin Mu, Yan Li, Jiagang Wang, and Jingfeng Jin
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312006 (2023)
Research on the Key Technologies of Microchip Laser Common-Path Frequency-Modulation Feedback Interferometer
Shulian Zhang, and Yuan Yang
Laser feedback interference (also known as self-mixing interference) is substantially different from traditional laser interference. The former occurs in the laser (light source), and the laser medium gain plays an important role in the interference effect (fringe form). The latter occurs only in the optical path outsi
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312007 (2023)
Research Progress of Ultra-Precision Measurement of Optical Surfaces for Manufacturing
Shanyong Chen, Shuai Xue, Yupeng Xiong, Xiaoqiang Peng, and Yifan Dai
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312011 (2023)
Research Status and Development Trend of Laser Multi-Degree-of-Freedom Simultaneous Measurement
Fei Long, Fajia Zheng, Peizhi Jia, Bin Zhang, Jiakun Li, and Qibo Feng
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312012 (2023)
Research Progress of High Precision Chromatic Confocal Displacement Measurement Technology
Jiao Bai, Jingwen Li, Xiaohao Wang, and Xinghui Li
With the rapid development of the advanced manufacturing industry, the chromatic confocal displacement measurement technology has attracted great attention due to its advantages of high precision, strong adaptability, and high efficiency. It has been widely used in many industries. This paper firstly introduces the app
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312014 (2023)
In-Situ Testing Techniques for Mechanical Properties of Materials: Development and Applications
Wenjuan Xing, Zhonghan Yu, Changyi Liu, and Hongwei Zhao
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312015 (2023)
Laser Interferometer Technology and Instruments for Sub-Nanometer and Picometer Displacement Measurements
Xionglei Lin, Xiaobo Su, Jianing Wang, Yunke Sun, and Pengcheng Hu
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312016 (2023)
MEMS Optical Acoustic Sensor
Yongqiu Zheng, Jiamin Chen, Xinyu Zhao, Jiandong Bai, Liyun Wu, and Chenyang Xue
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312017 (2023)
Research on Reflective Two-Dimensional Grating Measurement System
Hongzhong Liu, Yongsheng Shi, Lei Yin, Bangdao Chen, Biao Lei, Weitao Jiang, Dong Niu, Lanlan Wang, Wei Jiang, Guojun Li, and Jinju Chen
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312018 (2023)
A Six-Degree-of-Freedom Measurement Method Based on Swinging Multi-Camera Tracking
Shouqin Cao, Zijie Sun, Ze Yang, Yanbiao Sun, and Jigui Zhu
At present, for six-degrees-of-freedom measurement of industrial targets, the visual measurement technology has difficulty in taking account of the measurement efficiency, accuracy, and range. Therefore, this paper proposes a six-degree-of-freedom measurement method based on swinging multi-camera tracking to achieve hi
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312019 (2023)
Wavenumber-Domain Fast Reconstruction Technique Using Ultrasonic Scanning for Transverse Wave Imaging
Mu Chen, Haoran Jin, Keji Yang, and Bingfeng Ju
Ultrasonic nondestructive testing is of great significance to ensure the working of equipment in aerospace, petrochemical, railway, and other fields. Transverse wave ultrasonic testing is an important method for the detection of internal defects in solids due to its advantages of weak attenuation of vibration mode, low
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312020 (2023)
A High-Precision Integrated Calibration Method for Position and Attitude of Visual-Inertial System
Keyao Ma, Yongjie Ren, Jiarui Lin, Zhiyuan Niu, and Jigui Zhu
In the visual-inertial positioning system, the calibration of the sensor pose relationship plays a crucial role in realizing accurate spatial positioning. Existing calibration methods lack integration for multi-sensor systems, and the calibration accuracy is limited. In this paper, a high-precision integrated calibrati
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312021 (2023)
High-Precision Line Laser Three-Dimensional Measurement Method Based on Telecentric Imaging
Yayun Meng, Huiwen Deng, Guofeng Zhang, Lingyu Ge, Kailiang Lin, and Shuming Yang
High accuracy three-dimensional (3D) imaging of precision components is vital for industrial manufacturing and inspection. To address the low efficiency and low accuracy of the existing line laser measurement system, a line laser three-dimensional measurement system using telecentric imaging is proposed herein, and the
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312022 (2023)
Decoupling of Transmission and Reflection of Overlapping Images of Car Windows Based on Polarization Information
Junzhuo Zhou, Minglin Chen, Ruqi Feng, Yuan Zong, Jia Hao, and Yiting Yu
Owing to the development of smart cities, intelligent transportation, and the Skynet project, increased attention is being paid to the decoupling technology used in the transmission and reflection of the overlapping images of car windows, which is essential for checkpoint registration, driver monitoring, fugitive trail
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312023 (2023)
Method for Three-Dimensional Shape Measurements of Composite Surface Based on Fringe Projection and Dual-Transparent Display Screens
Yuexin Xiao, Zonghua Zhang, Shuo Liu, Ziyu Li, Nan Gao, Zhaozong Meng, and Feng Gao
Optical three-dimensional (3D) topography measurement technology has been widely used in different fields because of its non-destructive, rapid, high precision, and other advantages. Rapid and accurate measurements of the 3D morphology of specular/diffuse composite surfaces in industrial production have been an unsolve
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312024 (2023)
Design of Synthetic-Wave Absolute-Distance Interferometric System Using Two-Cavity Dual-Frequency Nd∶YAG Laser with Large Frequency-Difference
Mingxing Jiao, Fei Jiang, Juan Su, Junhong Xing, Yun Liu, Tianhong Lian, Jianning Liu, Xian Wang, and Hequn Li
A synthetic-wave absolute-distance interferometry system is proposed to achieve high-accuracy absolute-distance measurements. In this system, the light source is a quadrature-demodulated Pound-Drever-Hall frequency-stabilized two-cavity dual-frequency Nd∶YAG laser (TCDFL) with a significant frequency difference. A Mach
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0312025 (2023)
Reviews
[in Chinese]
Jiubin Tan, Shiyuan Liu, Weiqian Zhao, and Bingfeng Ju
Laser & Optoelectronics Progress
  • Publication Date: Feb. 10, 2023
  • Vol. 60, Issue 3, 0300000 (2023)