As the laser interference microscope testing technology is only suitable for the measurement of relative altitude in surface topography testing and is not available for absolute measurement, the method by using white light interference microscope testing technology is presented. The measuring instrument based on the white light interference theory is developed, and the calibration between the pixel of CCD and PZT is carried out. The topography of the testing surface is calculated with the micro-displacement of the center of zero class white light fringe, which is located through spatial frequency-domain algorithm. The experiment is carried out, and the result shows that the method is available for measuring the topography of plane surface, bench surface, film surface and sphere surface.