Interferogram region spreading technology in spatial domain

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 34 >Issue 4 >Page 397 > Article

Infrared and Laser Engineering
Vol. 34, Issue 4, 397 (2005)

Interferogram region spreading technology in spatial domain

[in Chinese]^1、2、*, [in Chinese]², and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Interferogram region spreading technology in spatial domain[J]. Infrared and Laser Engineering, 2005, 34(4): 397 Copy Citation Text

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References

[1] Bone D J,Bachor H A,Sandeman R J.Fringe pattern analyses using a 2 -D Fourier transform [J].Applied Optics, 1986,25:1653-1660.

[2] Rodier C, Rodier F.Interferogram analysis using Fourier transform technique[J].Applied Optics, 1987,26(9):1668-1673.

[3] Talamonti J J,Kay R B,Krebs D J.Numerical model estimating the capabilities and limitations of the fast Fourier transform technique in absolute interferomet[J].Applied Optics, 1996,35(13);2182-2191.

[6] Gerchberg R W. Supe-resolution through error energy reduction [J].Opt Acta, 1974,21: 709-720.

CLP Journals

[1] Ge Jinman, Su Junhong. Processing Technology of Interferogram of Thin Film Thickness Measurement[J]. Chinese Journal of Lasers, 2009, 36(s2): 252

[in Chinese], [in Chinese], [in Chinese]. Interferogram region spreading technology in spatial domain[J]. Infrared and Laser Engineering, 2005, 34(4): 397

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