• Laser & Optoelectronics Progress
  • Vol. 57, Issue 17, 173401 (2020)
Wanlu Xie, Xiaobin Wu*, Kuibo Wang, Yan Luo, and Yu Wang
Author Affiliations
  • R & D Center of Optoelectronic Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China
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    DOI: 10.3788/LOP57.173401 Cite this Article Set citation alerts
    Wanlu Xie, Xiaobin Wu, Kuibo Wang, Yan Luo, Yu Wang. Effect of Different Substrate Materials on Focusing Beam Performance of EUV Collector[J]. Laser & Optoelectronics Progress, 2020, 57(17): 173401 Copy Citation Text show less
    Optical path of EUV collection system
    Fig. 1. Optical path of EUV collection system
    Simulation model of EUV collector
    Fig. 2. Simulation model of EUV collector
    Temperature distribution of different collecting mirror reflection surfaces. (a) Fused silica; (b) SiC; (c) AlSi
    Fig. 3. Temperature distribution of different collecting mirror reflection surfaces. (a) Fused silica; (b) SiC; (c) AlSi
    Structural deformation distribution of different collecting mirror reflection surfaces. (a) Fused silica; (b) SiC; (c) AlSi
    Fig. 4. Structural deformation distribution of different collecting mirror reflection surfaces. (a) Fused silica; (b) SiC; (c) AlSi
    Spot diagrams of collection mirror after deformation. (a) Non-deformation; (b) fused silica; (c) SiC; (d) AlSi
    Fig. 5. Spot diagrams of collection mirror after deformation. (a) Non-deformation; (b) fused silica; (c) SiC; (d) AlSi
    ParameterFused silicaSiCAlSiAl
    Thermal conductivity/[W/(m·K)]1.30360140247
    Density /(g/cm3)2.203.212.552.70
    Young's ratio /GPa72.745011071
    Thermal expansion coefficient/(10-6/K)0.573.41223.6
    emissivity0.930.850.350.3
    Specific heat /[J/(kg·K)]670690834900
    Poisson's ratio0.170.1420.350.33
    Table 1. Characteristic parameters of fused silica, SiC, AlSi substrate, and Al support
    Temperature-riseSubstrate material
    Fused silicaSiCAlSi
    Minimum5.641.341.37
    Maximum7.681.361.39
    Table 2. Temperature-rise of collection mirror ellipsoidal reflecting surface℃
    StructuraldeformationSubstrate material
    Fused silicaSiCAlSi
    Maximum1.601.113.51
    Table 3. Structural deformation of collection mirror ellipsoidal reflecting surfaceμm
    Substrate material
    Non-deformationFused silicaSiCAlSi
    GEO radius /μm294.178297.248293.851303.955
    RMS radius /μm225.253225.282225.256225.281
    WFE /λ2.5157.8754.32710.586
    Table 4. Focusing performance of different collection mirrors after deformation
    Wanlu Xie, Xiaobin Wu, Kuibo Wang, Yan Luo, Yu Wang. Effect of Different Substrate Materials on Focusing Beam Performance of EUV Collector[J]. Laser & Optoelectronics Progress, 2020, 57(17): 173401
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