Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2 Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra

Jia Hongbao; Sun Jinghua; Xu Yao; Wu Dong; Lü Haibing; Yan Lianghong; Yuan Xiaodong

doi:10.3788/aos201232.0831001

Journals >Acta Optica Sinica >Volume 32 >Issue 8 >Page 831001 > Article

Acta Optica Sinica
Vol. 32, Issue 8, 831001 (2012)

Determination of Thickness and Optical Constants of Sol-Gel Derived TiO₂ Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra

Jia Hongbao^1、2、*, Sun Jinghua^1、2、3, Xu Yao¹, Wu Dong¹, Lü Haibing³, Yan Lianghong³, and Yuan Xiaodong³

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3788/aos201232.0831001 Cite this Article Set citation alerts

Jia Hongbao, Sun Jinghua, Xu Yao, Wu Dong, Lü Haibing, Yan Lianghong, Yuan Xiaodong. Determination of Thickness and Optical Constants of Sol-Gel Derived TiO₂ Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra[J]. Acta Optica Sinica, 2012, 32(8): 831001 Copy Citation Text

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