Yang Li, Yongxing Liu, Shixun Dai, Tiefeng Xu, Changgui Lin, Feifei Chen. Accuracy in Refractive Index Measurement of As2Se3 Chalcogenide Glass by IR Spectroscopic Ellipsometer[J]. Acta Optica Sinica, 2018, 38(6): 0612002
- Acta Optica Sinica
- Vol. 38, Issue 6, 0612002 (2018)
Fig. 1. Schematic of physical model
Fig. 2. Refractive indices and errors of specimens with different thicknesses
Fig. 3. Surface structural diagrams of specimens with different back side roughnesses. (a) S1; (b) S2; (c) S3
Fig. 4. Refractive indices and errors of specimens with different back side roughnesses
Fig. 5. Surface roughness of specimens versus polishing time
Fig. 6. Refractive indices and errors of specimens with different surface smoothnesses
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Table 1. Refractive indices of As2Se3 prism glass specimens
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Table 2. Parameters of specimens with different back side roughnesses
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