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    Journals >Laser & Optoelectronics Progress >Volume 47 >Issue 4 >Page 41202 > Article
    • Laser & Optoelectronics Progress
    • Vol. 47, Issue 4, 41202 (2010)
    Measurement Errors in 632.8 nm High Precision Phase-Shifting Fizeau Interferometer
    Wei Haoming1、2、*, Xing Tingwen1, Li Yun1、2, and Liu Zhixiang1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop47.041202 Cite this Article Set citation alerts
    Wei Haoming, Xing Tingwen, Li Yun, Liu Zhixiang. Measurement Errors in 632.8 nm High Precision Phase-Shifting Fizeau Interferometer[J]. Laser & Optoelectronics Progress, 2010, 47(4): 41202 Copy Citation Text show less
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    Wei Haoming, Xing Tingwen, Li Yun, Liu Zhixiang. Measurement Errors in 632.8 nm High Precision Phase-Shifting Fizeau Interferometer[J]. Laser & Optoelectronics Progress, 2010, 47(4): 41202
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