[4] M. Takeda. Spatial carrier heterodyne techniques for precision interferometry and profilometry: an overview[C]. Proc. SPIE, 1989, 1121: 73～88

[5] D. J. Bone, H.-A. Bachor, R. J. Sandeman. Fringe-pattern analysis using a 2-D Fourier transform[J]. Appl. Opt., 1986, 25(10): 1653～1660

[6] C. Roddier, F. Rodier. Interferogram analysis using Fourier transform techniques[J]. Appl. Opt., 1987, 26(9): 1668～1673

[7] J. H. Massig, J. Heppner. Fringe-pattern analysis with high accuracy by use of the Fourier-transform method: theory and experimental tests[J]. Appl. Opt., 2001, 40(13): 2081～2088

[12] A. Criminisi, P. Pérez, K. Toyama. Region filling and object removal by exemplar-based image inpainting[J]. IEEE Transactions on Image Processing, 2004, 13(9): 1200～1212