• High Power Laser and Particle Beams
  • Vol. 34, Issue 6, 063003 (2022)
Zhitong Cui*, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, and Zheng Liu
Author Affiliations
  • State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
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    DOI: 10.11884/HPLPB202234.210499 Cite this Article
    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Zheng Liu. Circuit simulation of GJB151B CS115 part П: The analysis of application[J]. High Power Laser and Particle Beams, 2022, 34(6): 063003 Copy Citation Text show less
    References

    [1] GJB 151B2013, Electromagic emission susceptibility requirements measurements f military equipment subsystems[S]

    [2] Cui Zhitong, Grassi F, Pignari S A. Circuit modeling of the test setup f pulsed current injection[C]Proceedings of 2016 AsiaPacific International Symposium on Electromagic Compatibility. Shenzhen, China: IEEE, 2016.

    [4] Cui Zhitong, Grassi F, Pignari S A, et al. Pulsed current injection setup and procedure to reproduce intense transient electromagnetic disturbance[J]. IEEE Transactions on Electromagnetic Compatibility, 60, 2065-2068(2018).

    [6] Cui Zhitong, Wei Bing, Grassi F, et al. Experimental analysis circuit modeling of pulsed current injection in wire pairs[C]Proceedings of 2018 IEEE International Symposium on Electromagic Compatibility 2018 IEEE AsiaPacific Symposium on Electromagic Compatibility. Singape: IEEE, 2018.

    [7] Grassi F, Marliani F, Pignari S A. Circuit modeling of injection probes for bulk current injection[J]. IEEE Transactions on Electromagnetic Compatibility, 49, 563-576(2007).

    [8] Paul C R. Introduction to electromagic compatibility[M]. New Jersey: Wiley, 1992: 184198.

    [9] Lafon F, Benlakhouy Y, De Daran F. Injection probe modeling f bulk current injection test on multi conduct transmission lines[C]Proceedings of IEEE Symposium on Embedded EMC. Rouen, France: IEEE, 2007: 290293.

    [11] Tesche F M, Ianoz M V, Karlsson T. EMC analysis methods computational models[M]. New Yk: John Wiley & Sons, Inc. , 1997.

    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Zheng Liu. Circuit simulation of GJB151B CS115 part П: The analysis of application[J]. High Power Laser and Particle Beams, 2022, 34(6): 063003
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