• High Power Laser and Particle Beams
  • Vol. 34, Issue 6, 063003 (2022)
Zhitong Cui*, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, and Zheng Liu
Author Affiliations
  • State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • show less
    DOI: 10.11884/HPLPB202234.210499 Cite this Article
    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Zheng Liu. Circuit simulation of GJB151B CS115 part П: The analysis of application[J]. High Power Laser and Particle Beams, 2022, 34(6): 063003 Copy Citation Text show less

    Abstract

    To design the test setup and predict the effect of GJB151B CS115 “impulse excitation bulk cable injection conducted susceptibility”, we introduced the circuit model of inductive pulse current injection for different type of cables. The influences on the injected voltage/current caused by the factors of the test setup are simulated and analyzed. Some regularity characteristics of CS115 test setting are summarized, and the method of CS115 test design and optimization by circuit simulation is proposed.
    Zhitong Cui, Wei Chen, Yayun Dong, Xin Nie, Wei Wu, Zheng Liu. Circuit simulation of GJB151B CS115 part П: The analysis of application[J]. High Power Laser and Particle Beams, 2022, 34(6): 063003
    Download Citation