• Laser & Optoelectronics Progress
  • Vol. 53, Issue 1, 11404 (2016)
Yang Yang1、2、*, Yu Guolei1、2, Li Peixu2, Xia Wei2, and Xu Xiangang1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop53.011404 Cite this Article Set citation alerts
    Yang Yang, Yu Guolei, Li Peixu, Xia Wei, Xu Xiangang. Measurement and Analysis of Junction Temperature of Semiconductor Laser Devices[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11404 Copy Citation Text show less
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    Yang Yang, Yu Guolei, Li Peixu, Xia Wei, Xu Xiangang. Measurement and Analysis of Junction Temperature of Semiconductor Laser Devices[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11404
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