Author Affiliations
Department of Optoelectronic Science and Technology, College of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610064, Chinashow less
Fig. 1. Schematic of measurement geometry
Fig. 2. Curve-fitting processing. (a) One line of fringes; (b) upper and lower envelopes of fringes obtained by extreme points; (c) background-eliminated fringes
Fig. 3. Piecewise-mean processing. (a) One line of piecewise fringes; (b) fringes after piecewise fitting; (c) background-eliminated fringes
Fig. 4. Simulated object and fringes. (a) Deformed fringes; (b) simulated object
Fig. 5. Reconstructed object by global-mean processing and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 6. Reconstructed object by curve-fitting processing and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 7. Reconstructed object by piecewise-mean processing and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 8. Reconstructed object by one-adjusting-factor processing and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 9. Reconstructed object by two-adjusting-factor processing and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 10. Reconstructed object with uncorrected phase and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 11. Reconstructed object with second-order corrected phase and reconstruction error. (a) Reconstructed object; (b) reconstruction error
Fig. 12. Experiment. (a) Reference fringes; (b) deformed fringes
Fig. 13. Reconstructions by multiple methods. (a) Reconstruction by Fourier transform; (b) reconstruction by global mean; (c) reconstruction by curve fitting; (d) reconstruction by piecewise mean; (e) reconstruction by one adjusting factor; (f) reconstruction by two adjusting factors
Fig. 14. Errors of reconstructions by multiple methods. (a) Reconstruction error by Fourier transform; (b) reconstruction error by global mean; (c) reconstruction error by curve fitting; (d) reconstruction error by piecewise mean; (e) reconstruction error by one adjusting factor; (f) reconstruction error by two adjusting factors
Fig. 15. Detailed comparisons. (a) Line 220 reconstructed surface; (b) magnification of local detail
Method | Maximum error /mm | Mean of error /mm | Standard deviation /mm | Time /s |
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Fourier transform | 7.36140 | 0.178190 | 0.495160 | 7.503960 | Global mean | 0.75495 | 0.106940 | 0.175780 | 14.120838 | Curve-fitting | 0.56657 | 0.072519 | 0.130660 | 25.083935 | Piecewise mean | 0.40549 | 0.055582 | 0.098196 | 20.676546 | One factor | 0.52737 | 0.073518 | 0.127150 | 12.993006 | Two factors | 0.36769 | 0.041162 | 0.077612 | 10.702224 |
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Table 1. Comparison of results by several methods
Parameter | Second-order modified | Unmodified |
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Maximum error /mm | 0.512370 | 0.799370 | Mean of error /mm | 0.054201 | 0.094652 | Standard deviation /mm | 0.096853 | 0.157670 | Time /s | 10.343965 | 2.912564 |
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Table 2. Comparison of results before and after second-order phase correction
Method | Fourier transform | Global mean | Curve-fitting | Piecewise mean | One factor | Two factors |
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Standard deviation /mm | 2.6877 | 0.4628 | 0.2984 | 0.2774 | 0.3047 | 0.2745 |
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Table 3. Standard deviation between multiple methods and PMP