Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 22 >Page 220601 > Article
    • Laser & Optoelectronics Progress
    • Vol. 56, Issue 22, 220601 (2019)
    Power Uniformity Optimization in Indoor Visible Light Communication Based on Ant Colony Algorithm
    Zhiqun Yang1, Jiran Liang1、*, and Luhong Mao2
    Author Affiliations
  • 1School of Microelectronics, Tianjin University, Tianjin, 300072, China
  • 2School of Automation, Tianjin University, Tianjin, 300072, China
    • show less
    DOI: 10.3788/LOP56.220601 Cite this Article Set citation alerts
    Zhiqun Yang, Jiran Liang, Luhong Mao. Power Uniformity Optimization in Indoor Visible Light Communication Based on Ant Colony Algorithm[J]. Laser & Optoelectronics Progress, 2019, 56(22): 220601 Copy Citation Text show less
    Cited By
    Article index updated: May. 19, 2024
    Citation counts are provided from Researching.
    The article is cited by 3 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (13)
    Equations (0)
    References (12)
    Cited By (3)
    Get Citation
    Copy Citation Text
    Zhiqun Yang, Jiran Liang, Luhong Mao. Power Uniformity Optimization in Indoor Visible Light Communication Based on Ant Colony Algorithm[J]. Laser & Optoelectronics Progress, 2019, 56(22): 220601
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology