• Chinese Optics Letters
  • Vol. 20, Issue 3, 031601 (2022)
Xingwang Chen1, Lei Chen1, Ying Wang1, Tao Wei1、2、*, Jing Hu1, Miao Cheng1, Qianqian Liu1、**, Wanfei Li1, Yun Ling1、3, and Bo Liu1、***
Author Affiliations
  • 1Suzhou Key Laboratory for Nanophotonic and Nanoelectronic Materials and Its Devices, School of Materials Science and Engineering, Suzhou University of Science and Technology, Suzhou 215009, China
  • 2State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
  • 3School of Electronic & Information Engineering, Suzhou University of Science and Technology, Suzhou 215009, China
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    DOI: 10.3788/COL202220.031601 Cite this Article Set citation alerts
    Xingwang Chen, Lei Chen, Ying Wang, Tao Wei, Jing Hu, Miao Cheng, Qianqian Liu, Wanfei Li, Yun Ling, Bo Liu. AgGeSbTe thin film as a negative heat-mode resist for dry lithography[J]. Chinese Optics Letters, 2022, 20(3): 031601 Copy Citation Text show less
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    Data from CrossRef

    [1] 周光迎 Zhou Guangying, 齐月静 Qi Yuejing, 李亮 Li Liang, 姜淼 Jiang Miao, 师江柳 Shi Jiangliu, 么铭怡 Yao Mingyi. 对准标记鲁棒性分析方法及仿真. Acta Optica Sinica, 43, 1113002(2023).

    Xingwang Chen, Lei Chen, Ying Wang, Tao Wei, Jing Hu, Miao Cheng, Qianqian Liu, Wanfei Li, Yun Ling, Bo Liu. AgGeSbTe thin film as a negative heat-mode resist for dry lithography[J]. Chinese Optics Letters, 2022, 20(3): 031601
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