• Chinese Optics Letters
  • Vol. 8, Issue s1, 73 (2010)
Stefan Jakobs1, Marc Lappschies1, Uwe Schallenberg1, Olaf Stenzel2, and Steffen Wilbrandt2
Author Affiliations
  • 1Mso Jena GmbH, Carl-Zeiss-Promenade 10, 07745 Jena, Germany
  • 2Fraunhofer IOF, Albert-Einstein-Stra?e 7, 07745 Jena, Germany
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    DOI: 10.3788/COL201008s1.0073 Cite this Article Set citation alerts
    Stefan Jakobs, Marc Lappschies, Uwe Schallenberg, Olaf Stenzel, Steffen Wilbrandt. Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering[J]. Chinese Optics Letters, 2010, 8(s1): 73 Copy Citation Text show less

    Abstract

    For single layers of SiO2, Nb2O5, and Ta2O5 that are deposited by plasma-assisted reactive magnetron sputtering (PARMS), we present measurement results for basic optical and mechanical properties, in particular, optical index, intrinsic film stress, thermal shift of spectral transmittance, and microroughness. We find high refractive indices combined with low intrinsic film roughness, moderate compressive stress, and almost a vanishing shift, indicate high potential for the production of high-performance optical coatings. The high thickness accuracy and process stability are exemplified by the measured spectral performance of multilayer stacks with about 200 single layers.
    Stefan Jakobs, Marc Lappschies, Uwe Schallenberg, Olaf Stenzel, Steffen Wilbrandt. Characterization of metal-oxide thin films deposited by plasma-assisted reactive magnetron sputtering[J]. Chinese Optics Letters, 2010, 8(s1): 73
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