Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

Minyang Wu; Yinhang Ma; Hao Cheng; Fujun Yang

doi:10.3788/AOS202040.1812002

Journals >Acta Optica Sinica >Volume 40 >Issue 18 >Page 1812002 > Article

Acta Optica Sinica
Vol. 40, Issue 18, 1812002 (2020)

Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

Minyang Wu¹, Yinhang Ma¹, Hao Cheng², and Fujun Yang^1、*

Author Affiliations

¹Jiangsu Key Laboratory of Engineering Mechanics, Southeast University, Nanjing, Jiangsu 211189, China

²Science and Technology on Reliability and Environment Engineering Laboratory, Beijing Institute of Structure and Environment Engineering, Beijing 100076, China

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DOI: 10.3788/AOS202040.1812002 Cite this Article Set citation alerts

Minyang Wu, Yinhang Ma, Hao Cheng, Fujun Yang. Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives[J]. Acta Optica Sinica, 2020, 40(18): 1812002 Copy Citation Text

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