[1] P. Baumeister. Design of multilayer filters by successive approximations［J］. J. Opt. Soc. Am., 1958, 48(12): 955～958

[2] N. Kaiser, C. J. Stolz. Optical Society of America′s 2007 Topical Meeting on Optical Interference Coatings: overview［J］. Appl. Opt., 2008, 47(13): OIC1～OIC7

[3] A. V. Tikhonravov, M. K. Trubetskov. On-line characterization and reoptimization of optical coatings［C］. SPIE, 2004, 5250: 406～413

[4] A. V. Tikhonravov, M. K. Trubetskov. Computational manufacturing as a bridge between design and production［J］. Appl. Opt., 2005, 44(32): 6877～6884

[5] A. V. Tikhonravov. Virtual deposition plant［C］. SPIE, 2005, 5870: 0D1～0D13

[6] K. Fiedrich, S. Wilbrandt, O. Stenzel et al.. Computational manufacturing of optical interference coatings: method, simulation results, and comparison with experiment［J］. Appl. Opt., 2010, 49(16): 3150～3162

[7] J. A. Aguilera, J. Aguilera, P. Baumeister et al.. Antireflection coatings for germanium IR optics: a comparison of numerical design methods［J］. Appl. Opt., 1988, 27(14): 2832～2840

[8] J. A. Dobrowolski, R. A. Kemp. Refinement of optical multilayer systems with different optimization procedures［J］. Appl. Opt., 1990, 29(19): 2876～2893

[9] J. P. Borgogno, P. Bousquet, E. Pelletier. Automatic determination of optical constants of inhomogeneous thin films［J］. Appl. Opt., 1982, 21(22): 4020～4029

[10] A. V. Tikhonravov, M. K. Trubetskov, B. T. Sullivan et al.. Influence of small inhomogeneties on the spectral charaterisitics of single thin films［J］. Appl. Opt., 1997, 36(28): 7188～7198

[11] A. V. Tikhonravov, M. K. Trubetskov, A. A. Tikhonravov et al.. Effects of interface roughness on the spectral properties of thin films and multilayers［J］. Appl. Opt., 2003, 42(25): 5140～5148

[12] C. K. Carniglia, D. G. Jensen. Single-layer model for surface roughness［J］. Appl. Opt., 2002, 41(16): 3167～3171

[13] A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev et al.. Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films［J］. Appl. Opt., 2002, 41(13): 2555～2560

[14] Wu Suyong, Long Xingwu, Huang Yun et al.. Methods for decreasing optical parameters reverse determination uncertainty of thin films caused by spectral mearement errors［J］. Chinese J. Lasers, 2009, 36(8): 2171～2177

[15] Wu Suyong. Application of genetic algorithm in the design of optical coatings［D］. Changsha: National University of Defense Technology, 2007. 22～32

[16] Wu Suyong, Long Xingwu, Huang Yun et al.. Calaulation model for spectral coefficient′s first and second order partial derivatives of multilayer optical coatings with respect to layer parameters［J］. High Power Laser and Particle Beams, 2010, 22(1): 83～90

[17] Wu Suyong, Long Xingwu, Yang Kaiyong. Accurate calculation and Matlab based fast realization of merit function′s Hesse matrix for the design of multilayer optical coating［J］. Optoelectronics Letters, 2009, 5(5): 359～363