• Chinese Journal of Quantum Electronics
  • Vol. 19, Issue 6, 541 (2002)
[in Chinese]1 and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Fitting of KNO3 Ferroelectric Thin-film Switching Currents[J]. Chinese Journal of Quantum Electronics, 2002, 19(6): 541 Copy Citation Text show less
    References

    [4] Orihara H, Ishibashi Y. A statistical theory of nucleation and growth in finite systems [J]. J. Phys. Soc. Japan,1992, 61(6): 1919-1925

    [5] Ishibashi Y, Orihara H. Size effect in ferroelectric switching [J]. J. Phys. Soc. Japan, 1992, 61(12): 4650-4656

    [6] Peuzin J C. Comment on domain inverse effects in Tr-LiNbO3 integrated optical device [J]. Appl. Phys. Lett.,1986, 148:1104-1108

    [7] Kugel V D, Rosenman G. Domain inversion in heat-treated LiNbO3 crystal [J]. Appl. Phys. Lett., 1993, 62(23):2902-2907

    [8] Dimmler K et al. Switching kinetics in KNOa ferroelectric thin-film memories [J]. J. Appl. Phys., 1987, 61(12):5467-5470

    [9] Orihara H et al. Pattern evolution in polarization reversal of ferroelectric liquid crystal [J]. J. Phys. Soc. Jpn.,1988, 57(11): 4101-4105

    [10] Ishibashi Y, Takagi Y. Note on ferroelectric domain switching [J]. J. Phys. Soc. Jpn., 1971, 31(2): 506-509

    [11] Hase T, Shiosaki T. Preparation and switching kinetics of Pb (Zr, Ti) Oa thin films deposited by reactive sputtering [J]. Jpn. J. Appl. Phys., 1991, 30:2159-2162

    [12] Duiker H M, Beale D. Grain-size effects in ferroelectric switching [J]. Phys. Rev., 1990, B41(1): 490-495

    [in Chinese], [in Chinese]. Fitting of KNO3 Ferroelectric Thin-film Switching Currents[J]. Chinese Journal of Quantum Electronics, 2002, 19(6): 541
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