Rui Liu, Zhiyong Liu, Chengxu Lin, Guangda Niu, Xuning Zhang, Bo Sun, Tielin Shi, Guanglan Liao, "Indium-doped perovskite-related cesium copper halide scintillator films for high-performance X-ray imaging," Photonics Res. 12, 369 (2024)

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- Photonics Research
- Vol. 12, Issue 2, 369 (2024)

Fig. 1. Characterization details of the Cs 3 Cu 2 I 5 : In powders. (a) XRD patterns of the Cs 3 Cu 2 I 5 powders samples doped with different indium concentrations (top), compared with the orthorhombic Cs 3 Cu 2 I 5 at the bottom (PDF#79-0333). (b) SEM image of the Cs 3 Cu 2 I 5 : In powders. (c) Elemental mapping images of the Cs 3 Cu 2 I 5 : 2 % In powders. (d) XPS survey spectrum of the Cs 3 Cu 2 I 5 : In powders. (e), (f) High-resolution XPS profiles of Cu (2 p 3 / 2 and 2 p 1 / 2 ) and In (3 d 5 / 2 and 3 d 3 / 2 ) of the Cs 3 Cu 2 I 5 powders synthesized with and without In, respectively.

Fig. 2. Ultraviolet detection performance of the Cs 3 Cu 2 I 5 : In films. (a) PL and PLE spectra of the Cs 3 Cu 2 I 5 : In films. (b) PL emission spectra of the Cs 3 Cu 2 I 5 films doped with different indium concentrations. (c) Comparison of the PL spectra of the films before and after being soaked in deionized water for 1 h. (d) PL decay spectra of the Cs 3 Cu 2 I 5 films with and without In + . (e) PLQY spectra of the Cs 3 Cu 2 I 5 : In films. (f) Configuration coordinate diagram of the photophysical dynamics in Cs 3 Cu 2 I 5 .

Fig. 3. X-ray detection performance of the Cs 3 Cu 2 I 5 : In powders. (a) X-ray absorption coefficients of the Cs 3 Cu 2 I 5 film, the CsPbBr 3 film, and commercial BGO scintillator as a function of photon energy. (b) RL spectra of the Cs 3 Cu 2 I 5 : 0.4 % In films, the undoped Cs 3 Cu 2 I 5 films, and the BGO films (dose rate, 4.85 mGy/s; voltage, 50 kV). The size (1 cm × 1 cm ) and thickness (1 mm) of the films are the same. (c) Dose-rate-dependent RL spectra of the Cs 3 Cu 2 I 5 : In films. (d) Normalized RL intensity of Cs 3 Cu 2 I 5 : In films and BGO under 24 h continuous radiation irradiation with an X-ray dose rate of 7.5 m Gy/s. (e) Signal-to-noise ratio of X-ray response of the Cs 3 Cu 2 I 5 : In films at different irradiation dose rates. (f) MTF of the Cs 3 Cu 2 I 5 : In films, measured by the slanted-edge method.

Fig. 4. Construction and application of a high-performance X-ray testing system. (a) Schematic diagram of the X-ray imaging system. (b) X-ray imaging of the Cs 3 Cu 2 I 5 : In films on the standard resolution card. (c) Photograph and X-ray image (dose rate, 963 μGy/s; tube voltage, 50 kV; beam current, 200 μA; exposure time, 10 s) of internal structure of the earphone; (d) internal circuitry of the microchip; (e) internal structure of the charger plug; (f) internal spring and filling of the pen.
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Table 1. Summary of X-Ray Scintillation Performances of Scintillators

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