• Photonics Research
  • Vol. 6, Issue 8, 776 (2018)
Yating Wan1,†,*, Daisuke Inoue1,2,†, Daehwan Jung1,†..., Justin C. Norman3, Chen Shang3, Arthur C. Gossard3,4 and John E. Bowers3,4|Show fewer author(s)
Author Affiliations
  • 1Institute for Energy Efficiency, University of California Santa Barbara, Santa Barbara, California 93106, USA
  • 2Institute of Innovative Research, Tokyo Institute of Technology, Tokyo 152-8552, Japan
  • 3Materials Department, University of California Santa Barbara, Santa Barbara, California 93106, USA
  • 4Department of Electrical and Computer Engineering, University of California Santa Barbara, Santa Barbara, California 93106, USA
  • show less
    DOI: 10.1364/PRJ.6.000776 Cite this Article Set citation alerts
    Yating Wan, Daisuke Inoue, Daehwan Jung, Justin C. Norman, Chen Shang, Arthur C. Gossard, John E. Bowers, "Directly modulated quantum dot lasers on silicon with a milliampere threshold and high temperature stability," Photonics Res. 6, 776 (2018) Copy Citation Text show less
    Schematic of the epilayer structure. Inset, AFM morphology of the uncapped dots.
    Fig. 1. Schematic of the epilayer structure. Inset, AFM morphology of the uncapped dots.
    (a) Schematic illustration and (b) tilted SEM image of one fabricated microring laser; (c) top view of the probed microring under infrared imaging.
    Fig. 2. (a) Schematic illustration and (b) tilted SEM image of one fabricated microring laser; (c) top view of the probed microring under infrared imaging.
    Measured L-I-V curve of a microring laser with intrinsic active region. The device features an outer ring radius of 15 μm and a ring waveguide width of 4 μm. Inset, zoomed-in view of the L-I curve in the low-injection region.
    Fig. 3. Measured L-I-V curve of a microring laser with intrinsic active region. The device features an outer ring radius of 15 μm and a ring waveguide width of 4 μm. Inset, zoomed-in view of the L-I curve in the low-injection region.
    Emission spectra for the same device in Fig. 3 at various injection currents under CW operation at room temperature. Inset, emission spectrum around lasing threshold.
    Fig. 4. Emission spectra for the same device in Fig. 3 at various injection currents under CW operation at room temperature. Inset, emission spectrum around lasing threshold.
    Measured L-I curves as a function of the heat sink temperature for two microring lasers with (a) an intrinsic active region and (b) a modulation p-doped active region. Both devices have an outer ring radius of 15 μm and a ring waveguide width of 4 μm. (c) Temperature-dependent threshold current versus heat sink temperature for the two microring lasers, where the dashed lines represent the linear fit to the experimental data.
    Fig. 5. Measured L-I curves as a function of the heat sink temperature for two microring lasers with (a) an intrinsic active region and (b) a modulation p-doped active region. Both devices have an outer ring radius of 15 μm and a ring waveguide width of 4 μm. (c) Temperature-dependent threshold current versus heat sink temperature for the two microring lasers, where the dashed lines represent the linear fit to the experimental data.
    Threshold currents as a function of outer ring radius for microring lasers (a) with an intrinsic active region and a modulation p-doped active region on the GaP/Si, and (b) on GaP/Si substrate and native GaAs substrate with an intrinsic active region.
    Fig. 6. Threshold currents as a function of outer ring radius for microring lasers (a) with an intrinsic active region and a modulation p-doped active region on the GaP/Si, and (b) on GaP/Si substrate and native GaAs substrate with an intrinsic active region.
    Small-signal modulation responses of the QD ring laser biased from 21 to 86 mA. The fitting curves are drawn using a three-pole fitting function H(f). Inset, L-I-V characteristics from the same device.
    Fig. 7. Small-signal modulation responses of the QD ring laser biased from 21 to 86 mA. The fitting curves are drawn using a three-pole fitting function H(f). Inset, L-I-V characteristics from the same device.
    3 dB bandwidth f3 dB and relaxation oscillation frequency fr versus square root of the bias current above threshold. Inset, damping rate γ versus squared relaxation oscillation frequency fr. The maximum 3 dB bandwidth limited by K-factor f3 dB,max is 9.7 GHz.
    Fig. 8. 3 dB bandwidth f3dB and relaxation oscillation frequency fr versus square root of the bias current above threshold. Inset, damping rate γ versus squared relaxation oscillation frequency fr. The maximum 3 dB bandwidth limited by K-factor f3dB,max is 9.7 GHz.
    (a) Impedance measurement of QD microring laser on Si; (b) equivalent circuit model used for the fitting. Measured and fitted curves of reflection S11 characteristics for reverse (−3 V) and forward (50 mA) biased condition from 0.14 to 5 GHz.
    Fig. 9. (a) Impedance measurement of QD microring laser on Si; (b) equivalent circuit model used for the fitting. Measured and fitted curves of reflection S11 characteristics for reverse (3  V) and forward (50 mA) biased condition from 0.14 to 5 GHz.
    Yating Wan, Daisuke Inoue, Daehwan Jung, Justin C. Norman, Chen Shang, Arthur C. Gossard, John E. Bowers, "Directly modulated quantum dot lasers on silicon with a milliampere threshold and high temperature stability," Photonics Res. 6, 776 (2018)
    Download Citation