[1] Rogalski A. Infrared Detectors[M]. New York: CRC Press, 2011.

[2] AseevA L. Photodetectors Based on the Cadmium-Mercury-Tellurium Epitaxial System[M]. Novosibirsk: SB RAS Publishing House, 2012.

[3] Bowden N, Brittain S, Evans A G, et al. Spontaneous formation of ordered structures in thin films of metals supported on an elastomeric polymer[J]. Nature, 1998, 393(14): 146-149.

[4] Genzer J, Groenewold J. Soft matter with hard skin: from skin wrinkles to templating and material characterization[J]. Soft Matter, 2006, 2: 310-323.

[5] Huck W, Bowden N, Onck P, et al. Ordering of spontaneously formed buckles on planar surfaces[J]. Langmuir, 2000, 16(7): 3497-3501.

[6] Meng Qingduan, Lv Yanqiu, Lu Zhengxiong, et al. Stress in InSb infrared focal plane array detector analyzed with ANSYS[J]. J Infrared Millim Waves, 2010, 29(6): 431-434. (in Chinese)

[7] Chris Littler. Characterization of impurities and defects in InSb and HgCdTe using novel magneto-optical techniques[C]//SPIE, 1993, 2021: 184-201.

[8] Mike Davis, Mark Greiner. Indium antimonide large-format detector arrays[J]. Optical Engineering, 2011, 50(6): 061016.

[9] Rawe R, Martin C, Garter M, et al. Novel high fill-factor, small pitch, reticulated InSb IR FPA design[C]//SPIE, 2005, 5783: 899-906.

[10] Zhou Huixin, Yin Shimin, Liu Shangqian, et al. Algorithm of blind pixels auto searching and compensation for IRFPA[J]. Acta Photonica Sinica, 2004, 33(5): 598-600. (in Chinese)

[11] Guo Jichang, Chen Minjun, Li Qiang, et al. Hardware and software design for invalid pixels processing of infrared focal plane array detectors[J]. Opto-Electronic Engineering, 2006, 33(6): 57-60. (in Chinese)

[12] Wang Wei, Fan Yangyu, Si Junjie, et al. Analysis on formation of bad pixel cluster in IRFPA[J]. Infrared and Laser Engineering, 2012, 41(11): 2857-2860. (in Chinese)

[13] Wang Wei, Fan Yangyu, Si Junjie, et al. Types and determination of bad pixels in IRFPA[J]. Infrared and Laser Engineering, 2012, 41(9): 2261-2264. (in Chinese)